Oxygen-Adsorption-Induced Anomalous Capacitance Degradation in Amorphous Indium-Gallium-Zinc-Oxide Thin-Film-Transistors under Hot-Carrier Stress
2012 ◽
Vol 159
(3)
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pp. H286-H289
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2015 ◽
Vol 135
(6)
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pp. 192-198
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2011 ◽
Vol 50
(3)
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pp. 03CB06
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2009 ◽
Vol 3
(7-8)
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pp. 239-241
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2014 ◽
Vol 53
(4S)
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pp. 04EF07
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2017 ◽
Vol 3
(10)
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pp. 1700221
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Keyword(s):
A Comparative Study on Fluorination and Oxidation of Indium–Gallium–Zinc Oxide Thin-Film Transistors
2018 ◽
Vol 39
(2)
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pp. 196-199
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