Environmental Stress Testing of Wafer-Level Al-Al Thermocompression Bonds: Strength and Hermeticity

N. Malik; E. Poppe; K. Schjølberg-Henriksen; M. M. V. Taklo; T. G. Finstad

doi:10.1149/2.0181507jss

Environmental Stress Testing of Wafer-Level Al-Al Thermocompression Bonds: Strength and Hermeticity

ECS Journal of Solid State Science and Technology ◽

10.1149/2.0181507jss ◽

2015 ◽

Vol 4 (7) ◽

pp. P251-P257 ◽

Cited By ~ 3

Author(s):

N. Malik ◽

E. Poppe ◽

K. Schjølberg-Henriksen ◽

M. M. V. Taklo ◽

T. G. Finstad

Keyword(s):

Environmental Stress ◽

Stress Testing ◽

Wafer Level

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Environmental Stress Testing of Wafer-Level Au-Au Thermocompression Bonds Realized at Low Temperature: Strength and Hermeticity

ECS Journal of Solid State Science and Technology ◽

10.1149/2.0201507jss ◽

2015 ◽

Vol 4 (7) ◽

pp. P236-P241 ◽

Cited By ~ 2

Author(s):

N. Malik ◽

H. R. Tofteberg ◽

E. Poppe ◽

T. G. Finstad ◽

K. Schjølberg-Henriksen

Keyword(s):

Low Temperature ◽

Environmental Stress ◽

Stress Testing ◽

Wafer Level

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Revealing Metal Corrosion Failures Using Wafer Level Temperature Cycle Stress Testing

10.1109/irws.1993.666312 ◽

2005 ◽

Author(s):

J.M. Duffalo ◽

J.E. Staszkow ◽

J.A. Chan ◽

P.D. Egelhoff ◽

H.A. Pollack ◽

...

Keyword(s):

Stress Testing ◽

Metal Corrosion ◽

Temperature Cycle ◽

Wafer Level

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Production AST with Computers Using the Taguchi MethodReprinted from Environmental Stress Testing Experiment Using the Taguchi Method, IEEE Transactions on Components, Packaging, and Manufacturing Technology, Part A, Vol. 18, No.1, pp. 39, with permission from the author and the IEEE, 1995.

Accelerated Stress Testing Handbook ◽

10.1109/9780470544051.ch15 ◽

2009 ◽

pp. 228-239

Keyword(s):

Taguchi Method ◽

Environmental Stress ◽

Stress Testing ◽

Manufacturing Technology ◽

Testing Experiment

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A Check List for Developing Accelerated Reliability Tests

Journal of the IEST ◽

10.17764/jiet.2.40.1.362154j648x14135 ◽

1997 ◽

Vol 40 (1) ◽

pp. 41-46

Author(s):

Hank Caruso

Keyword(s):

Environmental Stress ◽

Information Needs ◽

Stress Testing ◽

Test Time ◽

Optimum Level ◽

Reliability Testing ◽

Thought Process ◽

Check List ◽

Durability Test ◽

Time Compression

This paper provides the newcomer to or casual practitioner of environmental reliability testing with an integrated overview of important issues and considerations associated with accelerated reliability testing. These include step-stress testing, durability test time compression, and environmental stress screening. Other issues include the purpose of the test, the information needs of the customer, and the optimum level of assembly for testing. This information is presented in the form of a question and answer thought process that can be applied in commercial or military test situations.

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