Environmental Stress Testing of Electro–Optic Polymer Modulators

2009 ◽  
Vol 27 (11) ◽  
pp. 1527-1532 ◽  
Author(s):  
R. Dinu ◽  
Dan Jin ◽  
Guomin Yu ◽  
Baoquan Chen ◽  
Diyun Huang ◽  
...  
2006 ◽  
Author(s):  
Raluca Dinu ◽  
Danliang Jin ◽  
Diyun Huang ◽  
Mary K. Koenig ◽  
Anna M. Barklund ◽  
...  

2000 ◽  
Author(s):  
James H. Bechtel ◽  
Yongqiang Shi ◽  
Hua Zhang ◽  
William H. Steier ◽  
Cheng H. Zhang ◽  
...  

1999 ◽  
Author(s):  
Yongqiang Shi ◽  
James H. Bechtel ◽  
Wenshen Wang

1997 ◽  
Vol 71 (16) ◽  
pp. 2236-2238 ◽  
Author(s):  
Yongqiang Shi ◽  
Wenshen Wang ◽  
Weiping Lin ◽  
David J. Olson ◽  
James H. Bechtel

1997 ◽  
Vol 40 (1) ◽  
pp. 41-46
Author(s):  
Hank Caruso

This paper provides the newcomer to or casual practitioner of environmental reliability testing with an integrated overview of important issues and considerations associated with accelerated reliability testing. These include step-stress testing, durability test time compression, and environmental stress screening. Other issues include the purpose of the test, the information needs of the customer, and the optimum level of assembly for testing. This information is presented in the form of a question and answer thought process that can be applied in commercial or military test situations.


2016 ◽  
Vol 24 (17) ◽  
pp. 19020 ◽  
Author(s):  
Feng Qiu ◽  
Shiyoshi Yokoyama

2008 ◽  
Vol 93 (4) ◽  
pp. 043507 ◽  
Author(s):  
H. Chen ◽  
B. Chen ◽  
D. Huang ◽  
D. Jin ◽  
J. D. Luo ◽  
...  

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