Control of Nanostructure and Crystallographic Orientation in Electrodeposited ZnO Thin Films via Structure Directing Agents

2014 ◽  
Vol 161 (5) ◽  
pp. D195-D201 ◽  
Author(s):  
Keigo Ichinose ◽  
Tomoaki Mizuno ◽  
Matthew Schuette White ◽  
Tsukasa Yoshida
RSC Advances ◽  
2015 ◽  
Vol 5 (106) ◽  
pp. 87007-87018 ◽  
Author(s):  
Ahmad Hossein Adl ◽  
Piyush Kar ◽  
Samira Farsinezhad ◽  
Himani Sharma ◽  
Karthik Shankar

The type of sol-stabilizer profoundly influences the crystallographic orientation and optoelectronic properties of sol gel ZnO thin films.


2000 ◽  
Vol 23 (2) ◽  
pp. 75-95
Author(s):  
A. T. Kollias ◽  
E. D. Tsamis ◽  
J. N. Avaritsiotis

The piezoelectric properties of reactively sputtered ZnO thin films deposited on glass and silicon substrates were studied in order to assess their potential for the construction of RF overmoded filters. Films of high crystallographic orientation {002}, as shown by XRD measurements and SEM observations, and high value ofkeff2, calculated with the aid of the BVD model, were obtained after the optimization of the deposition conditions, with highly repetitive properties. Simple devices were designed and constructed on silicon substrates which showed a quality factor of 1000 without the use of a Bragg acoustic reflector, and a temperature drift of –30ppm/℃.


2010 ◽  
Vol 25 (7) ◽  
pp. 711-716 ◽  
Author(s):  
Xue-Tao WANG ◽  
Li-Ping ZHU ◽  
Zhi-Gao YE ◽  
Zhi-Zhen YE ◽  
Bing-Hui ZHAO

2010 ◽  
Vol 114 (46) ◽  
pp. 19815-19821 ◽  
Author(s):  
Anthony J. Morfa ◽  
Gary Beane ◽  
Benjamin Mashford ◽  
Birendra Singh ◽  
Enrico Della Gaspera ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document