scholarly journals Focused-Ion-Beam-Milled Carbon Nanoelectrodes for Scanning Electrochemical Microscopy

2015 ◽  
Vol 163 (4) ◽  
pp. H3032-H3037 ◽  
Author(s):  
Ran Chen ◽  
Keke Hu ◽  
Yun Yu ◽  
Michael V. Mirkin ◽  
Shigeru Amemiya
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Scanning Electrochemical Microscopy ◽  
Electrochemical Microscopy

Long Term Corrosion Behaviour of Carbon Steel During Anaerobic to Aerobic Cycling Under Near-Neutral pH Saline Conditions

2010 ◽  
Author(s):  
Brent W. A. Sherar ◽  
Peter G. Keech ◽  
Zack Qin ◽  
Fraser King ◽  
David W. Shoesmith ◽  
...  
Keyword(s):  
Carbon Steel ◽  
Focused Ion Beam ◽  
Corrosion Behaviour ◽  
Ion Beam ◽  
Cycle Number ◽  
Corrosion Rates ◽  
Anaerobic Corrosion ◽  
Film Porosity ◽  
Electrochemical Microscopy

This paper investigates the long term corrosion behaviour of pretreated carbon steel under alternating anaerobic to aerobic cycles over 238 days. Changes in steel behaviour were observed electrochemically by monitoring the corrosion potential, and calculating changes to corrosion rate from linear polarization resistance. With increasing cycle number the corrosion process becomes localized at a small number of locations, consistent with the formation of tubercles. Periods of aerobic corrosion were associated with more positive potentials (between −500 mV to −350 mV) and high corrosion rates (70 to 120 μm yr−1); whereas anaerobic corrosion yielded more negative potentials (< −650 mV) and lower corrosion rates (40 to 50 μm yr−1). Upon termination of the experiment, corrosion product deposits were characterized by several techniques: scanning electrochemical microscopy to detect morphology; focused ion beam and cross sectioning to judge film thickness and film porosity; and Raman Spectroscopy to identify iron phases.

Antimicriobial Activity of Silver-Nanoparticles studied by Scanning Probe Microscopy

2020 ◽  
Author(s):  
Giada Caniglia ◽  
Anna Heinzmann ◽  
Maria Chiara Sportelli ◽  
Antonio Valentini ◽  
Nicola Cioffi ◽  
...  
Keyword(s):  
Silver Nanoparticles ◽  
Antimicrobial Agents ◽  
Ion Beam ◽  
Electrochemical Techniques ◽  
Scanning Electrochemical Microscopy ◽  
Bacterial Biofilms ◽  
Release Mechanism ◽  
Probe Microscopy ◽  
Square Wave Stripping Voltammetry ◽  
Electrochemical Microscopy

<p>Biofilms are well-organized sessile communities which exhibit an increased tolerance against antimicrobial and antibiotic treatments in comparison with their planktonic counterparts. Biofilms are ubiquitous and due to their high resilience, the problem with contamination of medical implants leads to serious health problems [1]. Within the last decades, novel therapies to prevent the formation of biofilms have been developed and, among others, antimicrobials based on metal nanoparticles (NPs) have been intensively studied [2], due to their ability to reduce biofilm formation. Silver nanoparticles (AgNPs) are known to be effective antimicrobial agents, as silver(I) has the ability to penetrate the cell and produce oxidative stress via the generation of reactive oxygen species (ROS) [3]. To understand the release mechanism of silver(I) ions, scanning electrochemical probe microscopy such as scanning electrochemical microscopy (SECM) is highly suitable.</p> <p>In this contribution, biocompatible AgNPs-fluoropolymer (Ag-CF<sub>x</sub>) composite films, prepared by ion beam sputtering (IBS) deposition [4], are investigated in respect to silver(I) release associated to the swelling of the antimicrobial film. The mechanism of the silver(I) release is studied real-time by scanning electrochemical microscopy (SECM) in combination with square-wave stripping voltammetry and the relation between controlled silver(I) release and the swelling of Ag-CF<sub>x</sub> films will be presented, combining electrochemical techniques and atomic force microscopy (AFM).</p> <p> </p> <p>References</p> <p>[1] G.C. Anderson, et al. Innate and Induced Resistance Mechanisms of Bacterial Biofilms. In Bacterial Biofilms; Romeo, T., Ed.; Springer Berlin Heidelberg: Berlin, Heidelberg, <strong>2008</strong>; pp 85–105.</p> <p>[2] M.C. Sportelli, et al. Nano-Antimicrobials Based on Metals. In Novel Antimicrobial Agents and Strategies; John Wiley & Sons, Ltd, <strong>2014</strong>; pp 181–218.</p> <p>[3] N. Durán, et al. Nanomedicine, <strong>2016</strong>, 12(3), 789-799.</p> <p>[4] M.C. Sportelli, et al. <strong>Sci. Rep</strong>. 2017, 7 (1), 11870.</p> <p> </p> <p>Acknowledgements</p> <p>Financial support is acknowledged from European Union’s 2020 research and innovation program under the Marie Sklodowska-Curie Grant Agreement No. 813439.</p>

Nanocomposite Polyurethane Foams Via POSS Blends

2002 ◽  
Vol 733 ◽  
Author(s):  
Brock McCabe ◽  
Steven Nutt ◽  
Brent Viers ◽  
Tim Haddad
Keyword(s):  
High Temperature ◽  
Sample Preparation ◽  
Room Temperature ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Polyurethane Foams ◽  
Development Projects ◽  
Polymer Systems ◽  
Polyurethane Resin ◽  
Military Development

AbstractPolyhedral Oligomeric Silsequioxane molecules have been incorporated into a commercial polyurethane formulation to produce nanocomposite polyurethane foam. This tiny POSS silica molecule has been used successfully to enhance the performance of polymer systems using co-polymerization and blend strategies. In our investigation, we chose a high-temperature MDI Polyurethane resin foam currently used in military development projects. For the nanofiller, or “blend”, Cp7T7(OH)3 POSS was chosen. Structural characterization was accomplished by TEM and SEM to determine POSS dispersion and cell morphology, respectively. Thermal behavior was investigated by TGA. Two methods of TEM sample preparation were employed, Focused Ion Beam and Ultramicrotomy (room temperature).

An Study of Influence of Imperfections on the Delamination of Diamond-Like Carbon Films

2002 ◽  
Vol 719 ◽  
Author(s):  
Myoung-Woon Moon ◽  
Kyang-Ryel Lee ◽  
Jin-Won Chung ◽  
Kyu Hwan Oh
Keyword(s):  
Cross Sections ◽  
Focused Ion Beam ◽  
Imaging System ◽  
Ion Beam ◽  
Carbon Films ◽  
Diamond Like Carbon ◽  
Glass Substrates ◽  
Atomic Force ◽  
Initiation And Propagation

AbstractThe role of imperfections on the initiation and propagation of interface delaminations in compressed thin films has been analyzed using experiments with diamond-like carbon (DLC) films deposited onto glass substrates. The surface topologies and interface separations have been characterized by using the Atomic Force Microscope (AFM) and the Focused Ion Beam (FIB) imaging system. The lengths and amplitudes of numerous imperfections have been measured by AFM and the interface separations characterized on cross sections made with the FIB. Chemical analysis of several sites, performed using Auger Electron Spectroscopy (AES), has revealed the origin of the imperfections. The incidence of buckles has been correlated with the imperfection length.

Low Energy Ar Ion Milling of FIB TEM Specimens from 14 nm and Future FinFET Technologies

2018 ◽  
Author(s):  
C.S. Bonifacio ◽  
P. Nowakowski ◽  
M.J. Campin ◽  
M.L. Ray ◽  
P.E. Fischione
Keyword(s):  
Field Effect Transistor ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Specimen Preparation ◽  
Ion Milling ◽  
Transmission Electron ◽  
High Resolution Tem ◽  
Effect Transistor ◽  
20 Nm ◽  
Argon Ion

Abstract Transmission electron microscopy (TEM) specimens are typically prepared using the focused ion beam (FIB) due to its site specificity, and fast and accurate thinning capabilities. However, TEM and high-resolution TEM (HRTEM) analysis may be limited due to the resulting FIB-induced artifacts. This work identifies FIB artifacts and presents the use of argon ion milling for the removal of FIB-induced damage for reproducible TEM specimen preparation of current and future fin field effect transistor (FinFET) technologies. Subsequently, high-quality and electron-transparent TEM specimens of less than 20 nm are obtained.

Automated Diagonal Slice and View Solution for 3D Device Structure Analysis

2018 ◽  
Author(s):  
Sang Hoon Lee ◽  
Jeff Blackwood ◽  
Stacey Stone ◽  
Michael Schmidt ◽  
Mark Williamson ◽  
...  
Keyword(s):  
Cross Section ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Image Data ◽  
Planar Surface ◽  
Device Structure ◽  
Cross Sectional ◽  
Device Structures ◽  
The Cross ◽  
Planar Analysis

Abstract The cross-sectional and planar analysis of current generation 3D device structures can be analyzed using a single Focused Ion Beam (FIB) mill. This is achieved using a diagonal milling technique that exposes a multilayer planar surface as well as the cross-section. this provides image data allowing for an efficient method to monitor the fabrication process and find device design errors. This process saves tremendous sample-to-data time, decreasing it from days to hours while still providing precise defect and structure data.

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