Effect of Exposure to Ultraviolet-Activated Oxygen on the Electrical Characteristics of Amorphous Indium Gallium Zinc Oxide Thin Film Transistors
2017 ◽
Vol 9
(15)
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pp. 13278-13285
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2013 ◽
Vol 8
(4)
◽
pp. 361-365
◽
2015 ◽
Vol 135
(6)
◽
pp. 192-198
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Keyword(s):
Keyword(s):