Effects of Thermal Annealing on La2O3 Gate Dielectric of InGaZnO Thin-Film Transistor
2015 ◽
Vol 62
(7)
◽
pp. 2313-2319
◽
Keyword(s):
2019 ◽
Vol 123
(33)
◽
pp. 20278-20286
◽
Keyword(s):
2009 ◽
Vol 53
(6)
◽
pp. 621-625
◽
Keyword(s):
2013 ◽
Vol 13
(5)
◽
pp. 3313-3316
◽
2019 ◽
Vol 96
◽
pp. 8-11
◽
Keyword(s):
2016 ◽
Vol 63
(5)
◽
pp. 1928-1933
◽