Comparative Study of Nb2O5, NbLaO, and La2O3as Gate Dielectric of InGaZnO Thin-Film Transistor
2016 ◽
Vol 63
(5)
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pp. 1928-1933
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2015 ◽
Vol 62
(7)
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pp. 2313-2319
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Keyword(s):
2019 ◽
Vol 123
(33)
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pp. 20278-20286
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Keyword(s):
2009 ◽
Vol 53
(6)
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pp. 621-625
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2013 ◽
Vol 13
(5)
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pp. 3313-3316
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2020 ◽
Vol 41
(6)
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pp. 856-859
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