Characterization of Tetrahedral Amorphous Carbon (Ta-C) Thin Films with >6GPa Compressive Stress and Application in Sub-32nm p-MOSFET Strain Engineering
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2008 ◽
Vol 23
(1)
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pp. 180-184
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2001 ◽
Vol 206-213
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pp. 531-534
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2011 ◽
Vol 257
(10)
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pp. 4699-4705
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2002 ◽
Vol 48
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pp. 205-210
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