(Invited) In Situ Transmission Electron Microscopy Analysis of Conductive Filament in Resistance Random Access Memories

2019 ◽  
Vol 41 (7) ◽  
pp. 81-92
Author(s):  
Yasuo Takahashi ◽  
Takashi Fujii ◽  
Masashi Arita ◽  
Ichiro Fujiwara
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Random Access ◽  
Conductive Filament ◽  
Transmission Electron Microscopy Analysis ◽  
Transmission Electron ◽  
Electron Microscopy Analysis ◽  
Microscopy Analysis

scholarly journals In Situ Transmission Electron Microscopy Analysis of Copper–Germanium Nanowire Solid-State Reaction

Nano Letters ◽  
2019 ◽  
Vol 19 (12) ◽  
pp. 8365-8371 ◽  
Author(s):  
Khalil El hajraoui ◽  
Eric Robin ◽  
Clemens Zeiner ◽  
Alois Lugstein ◽  
Stéphanie Kodjikian ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Solid State ◽  
Solid State Reaction ◽  
Transmission Electron Microscopy Analysis ◽  
Transmission Electron ◽  
Electron Microscopy Analysis ◽  
Microscopy Analysis
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