Transmission electron microscopy analysis of extended defects in multicrystalline silicon using in-situ EBIC/FIB sample preparation

2012 ◽  
Vol 10 (1) ◽  
pp. 32-35 ◽  
Author(s):  
M. A. Falkenberg ◽  
M. Seibt
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Sample Preparation ◽  
Multicrystalline Silicon ◽  
Extended Defects ◽  
Transmission Electron Microscopy Analysis ◽  
Transmission Electron ◽  
Electron Microscopy Analysis ◽  
Microscopy Analysis

scholarly journals In Situ Transmission Electron Microscopy Analysis of Copper–Germanium Nanowire Solid-State Reaction

Nano Letters ◽  
2019 ◽  
Vol 19 (12) ◽  
pp. 8365-8371 ◽  
Author(s):  
Khalil El hajraoui ◽  
Eric Robin ◽  
Clemens Zeiner ◽  
Alois Lugstein ◽  
Stéphanie Kodjikian ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Solid State ◽  
Solid State Reaction ◽  
Transmission Electron Microscopy Analysis ◽  
Transmission Electron ◽  
Electron Microscopy Analysis ◽  
Microscopy Analysis
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