The Reliability Study and Device Modeling for p-HEMT Microwave Power Transistors

2019 ◽  
Vol 41 (6) ◽  
pp. 175-187
Author(s):  
Szu-Ling Liu ◽  
H.M. Chang ◽  
Tsu Chang ◽  
Hsuan-Ling Kao ◽  
Chun-Hu Cheng ◽  
...  
1969 ◽  
Author(s):  
E. Hughes ◽  
K. Wilson ◽  
G.N. Wills ◽  
L.J. Fey

Sign in / Sign up

Export Citation Format

Share Document