Characterization on Bandedge Electronic Structure of MgO Added Bi[sub 1.5]Zn[sub 1.0]Nb[sub 1.5]O[sub 7] Gate Dielectrics for ZnO-Thin Film Transistors
2011 ◽
Vol 14
(1)
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pp. G4
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2019 ◽
Vol 21
(5)
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pp. 370-379
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2014 ◽
Vol 25
(1)
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pp. 134-141
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2013 ◽
Vol 2
(6)
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pp. P287-P291
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