The Effect of Illumination on the Negative Bias Temperature Instability in Zinc Tin Oxide Thin Film Transistors

Un Ki Kim; Jeong Hwan Kim; Him Chan Oh; Yoon Jang Chung; Cheol Seong Hwang

doi:10.1149/1.3481254

The Effect of Illumination on the Negative Bias Temperature Instability in Zinc Tin Oxide Thin Film Transistors

ECS Transactions ◽

10.1149/1.3481254 ◽

2019 ◽

Vol 33 (5) ◽

pp. 325-330

Author(s):

Un Ki Kim ◽

Jeong Hwan Kim ◽

Him Chan Oh ◽

Yoon Jang Chung ◽

Cheol Seong Hwang

Keyword(s):

Thin Film ◽

Tin Oxide ◽

Thin Film Transistors ◽

Oxide Thin Film ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Bias Temperature Instability ◽

Zinc Tin Oxide

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The Effect of Illumination on the Negative Bias Temperature Instability in Zinc Tin Oxide Thin Film Transistors

ECS Meeting Abstracts ◽

10.1149/ma2010-02/29/1838 ◽

2010 ◽

Keyword(s):

Thin Film ◽

Tin Oxide ◽

Thin Film Transistors ◽

Oxide Thin Film ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Bias Temperature Instability ◽

Zinc Tin Oxide

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The effects of device geometry on the negative bias temperature instability of Hf-In-Zn-O thin film transistors under light illumination

Applied Physics Letters ◽

10.1063/1.3541783 ◽

2011 ◽

Vol 98 (2) ◽

pp. 023507 ◽

Cited By ~ 16

Author(s):

Jeong Hwan Kim ◽

Un Ki Kim ◽

Yoon Jang Chung ◽

Ji Sim Jung ◽

Sang Ho Ra ◽

...

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Light Illumination ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Bias Temperature Instability ◽

Device Geometry

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Improved negative bias illumination instability of sol-gel gallium zinc tin oxide thin film transistors

Applied Physics Letters ◽

10.1063/1.3646388 ◽

2011 ◽

Vol 99 (15) ◽

pp. 152102 ◽

Cited By ~ 24

Author(s):

Seok-Jun Seo ◽

Jun Hyuck Jeon ◽

Young Hwan Hwang ◽

Byeong-Soo Bae

Keyword(s):

Thin Film ◽

Tin Oxide ◽

Thin Film Transistors ◽

Sol Gel ◽

Oxide Thin Film ◽

Negative Bias ◽

Zinc Tin Oxide

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Degradation of Low Temperature Polycrystalline Silicon Thin Film Transistors under Negative Bias Temperature Instability Stress with Illumination Effect

Journal of The Electrochemical Society ◽

10.1149/1.3265456 ◽

2010 ◽

Vol 157 (2) ◽

pp. J29 ◽

Cited By ~ 4

Author(s):

Chia-Sheng Lin ◽

Ying-Chung Chen ◽

Ting-Chang Chang ◽

Hung-Wei Li ◽

Wei-Che Hsu ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Silicon Thin Film ◽

Temperature Instability ◽

Bias Temperature Instability ◽

Illumination Effect

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Negative bias temperature instability of Rf-sputtered Mg0.05Zn0.95O thin film transistors with MgO gate dielectrics

Semiconductor Science and Technology ◽

10.1088/0268-1242/26/10/105007 ◽

2011 ◽

Vol 26 (10) ◽

pp. 105007 ◽

Cited By ~ 13

Author(s):

Chih-Hung Li ◽

Yi-Shiuan Tsai ◽

Jian Z Chen

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Gate Dielectrics ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Bias Temperature Instability

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Illumination-Assisted Negative Bias Temperature Instability Degradation in Low Temperature Polycrystalline Silicon Thin-Film Transistors

Electrochemical and Solid-State Letters ◽

10.1149/1.3115400 ◽

2009 ◽

Vol 12 (6) ◽

pp. H229 ◽

Cited By ~ 1

Author(s):

Chia-Sheng Lin ◽

Ying-Chung Chen ◽

Ting-Chang Chang ◽

Wei-Che Hsu ◽

Shih-Ching Chen ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Silicon Thin Film ◽

Temperature Instability ◽

Bias Temperature Instability

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Mechanism of negative‐bias temperature instability in polycrystalline‐silicon thin film transistors

Journal of Applied Physics ◽

10.1063/1.358430 ◽

1994 ◽

Vol 76 (12) ◽

pp. 8160-8166 ◽

Cited By ~ 19

Author(s):

S. Maeda ◽

S. Maegawa ◽

T. Ipposhi ◽

H. Nishimura ◽

T. Ichiki ◽

...

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Silicon Thin Film ◽

Temperature Instability ◽

Bias Temperature Instability

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Plasma Damage-Enhanced Negative Bias Temperature Instability in Low-Temperature Polycrystalline Silicon Thin-Film Transistors

IEEE Electron Device Letters ◽

10.1109/led.2006.883564 ◽

2006 ◽

Vol 27 (11) ◽

pp. 893-895 ◽

Cited By ~ 7

Author(s):

C.-Y. Chen ◽

J.-W. Lee ◽

W.-C. Chen ◽

H.-Y. Lin ◽

K.-L. Yeh ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Silicon Thin Film ◽

Plasma Damage ◽

Temperature Instability ◽

Bias Temperature Instability

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Negative Bias Temperature Instability Dominated Degradation of Metal-Induced Laterally Crystallized p-Type Polycrystalline Silicon Thin-Film Transistors

IEEE Transactions on Electron Devices ◽

10.1109/ted.2009.2014428 ◽

2009 ◽

Vol 56 (4) ◽

pp. 587-594 ◽

Cited By ~ 22

Author(s):

Chunfeng Hu ◽

Mingxiang Wang ◽

Bo Zhang ◽

Man Wong

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Silicon Thin Film ◽

Temperature Instability ◽

Bias Temperature Instability ◽

P Type

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Dynamic Negative Bias Temperature Instability (NBTI) of Low-Temperature Polycrystalline Silicon (LTPS) Thin-Film Transistors

IEEE Electron Device Letters ◽

10.1109/led.2008.919603 ◽

2008 ◽

Vol 29 (5) ◽

pp. 477-479 ◽

Cited By ~ 17

Author(s):

J. C. Liao ◽

Y. K. Fang ◽

C. H. Kao ◽

C. Y. Cheng

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Bias Temperature Instability

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