Characteristics of SiO[sub x] Thin Film Deposited by Atmospheric Pressure Plasma-Enhanced Chemical Vapor Deposition Using PDMS∕O[sub 2]∕He

2009 ◽  
Vol 156 (7) ◽  
pp. D248 ◽  
Author(s):  
J. H. Lee ◽  
Y. S. Kim ◽  
J. S. Oh ◽  
S. J. Kyung ◽  
J. T. Lim ◽  
...  
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