Effects of Substrate Cooling on the Ionic Conductivity of Ta2O5 Solid-Electrolyte Thin Films Prepared by Reactive Sputtering Using H2O Gas

2019 ◽  
Vol 13 (26) ◽  
pp. 55-60 ◽  
Author(s):  
Yoshio Abe ◽  
Fei Peng ◽  
Yasuhiro Takiguchi ◽  
Midori Kawamura ◽  
Katsutaka Sasaki ◽  
...  
Keyword(s):  
Thin Films ◽  
Ionic Conductivity ◽  
Solid Electrolyte ◽  
Reactive Sputtering

Structure and Ionic Conductivity of Lithio-Borate Thin Films

1990 ◽  
Vol 210 ◽  
Author(s):  
P. Dzwonkowski ◽  
M. Eddrief ◽  
C. Julien ◽  
M. Balkanski
Keyword(s):  
Thin Films ◽  
Ionic Conductivity ◽  
Solid Electrolyte ◽  
Ionic Conduction ◽  
Complex Impedance ◽  
Oxide System ◽  
Lithium Oxide ◽  
Process Conditions ◽  
Lithium Metaborate ◽  
Evaporation Technique

AbstractThin films of vitreous solid electrolyte in the boron-oxide/lithium oxide system have been grown using a thermal evaporation technique. Solid electrolyte films of composition B2O3-xLi2O with 0.5≤x≤5 are obtained from a mixture of lithium metaborate and lithium oxide in good proportion. Structure and ionic conduction are studied as a function of the glass modifier concentration and process conditions. The structure is investigated by the mid-infrared absorption spectroscopyof films deposited on a silicon wafer. Comparison with bulk materials whose structures are known shows that the films have a similar structure, and exhibit the transformation of boroxol rings into triborate or di-triborate units as the Li2O concentration increases. The ionic conductivity has been studied over wide frequency and temperatureranges using the complex impedance spectroscopy in a sandwiched geometry. The ionic conductivity increases with increasing Li content and exhibits a maximum value for B2O3-3Li2O.

Epitaxial Strain-Controlled Ionic Conductivity in Li-Ion Solid Electrolyte Li0.33La0.56TiO3 Thin Films

2015 ◽  
Vol 15 (5) ◽  
pp. 2187-2191 ◽  
Author(s):  
Jie Wei ◽  
Daisuke Ogawa ◽  
Tomoteru Fukumura ◽  
Yasushi Hirose ◽  
Tetsuya Hasegawa
Keyword(s):  
Thin Films ◽  
Ionic Conductivity ◽  
Solid Electrolyte ◽  
Epitaxial Strain ◽  
Li Ion

scholarly journals Effect of oxygen pressure on structure and ionic conductivity of epitaxial Li0.33La0.55TiO3 solid electrolyte thin films produced by pulsed laser deposition

RSC Advances ◽  
2016 ◽  
Vol 6 (66) ◽  
pp. 61974-61983 ◽  
Author(s):  
K. Kamala Bharathi ◽  
H. Tan ◽  
S. Takeuchi ◽  
L. Meshi ◽  
H. Shen ◽  
...  
Keyword(s):  
Thin Films ◽  
Ionic Conductivity ◽  
Single Crystal ◽  
Solid Electrolyte ◽  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Epitaxial Films ◽  
Laser Deposition ◽  
Partial Pressures ◽  
Effect Of Oxygen

We report on the ionic conductivity of Li0.33La0.55TiO3 (LLTO) epitaxial films grown on the (100) and (111) surfaces of single crystal SrTiO3 (STO) substrates at different oxygen partial pressures (from 1.33 to 26.66 Pa).

An Impedancemetric Micro NO2 Sensor Using Oxide and Solid-Electrolyte Thin-Films

2020 ◽  
Vol 140 (11) ◽  
pp. 305-308
Author(s):  
Tsuyoshi Sakai ◽  
Satoko Takase ◽  
Youichi Shimizu
Keyword(s):  
Thin Films ◽  
Solid Electrolyte

Preparation of CdS Thin Films by Reactive Sputtering Method

Shinku ◽  
1974 ◽  
Vol 17 (1) ◽  
pp. 19-22 ◽  
Author(s):  
Hiroharu HIRABAYASHI ◽  
Minoru NOGAMI
Keyword(s):  
Thin Films ◽  
Reactive Sputtering ◽  
Cds Thin Films

scholarly journals High Pressure X-ray Diffraction as a Tool for Designing Doped Ceria Thin Films Electrolytes

Coatings ◽  
2021 ◽  
Vol 11 (6) ◽  
pp. 724
Author(s):  
Sara Massardo ◽  
Alessandro Cingolani ◽  
Cristina Artini
Keyword(s):  
Thin Films ◽  
High Pressure ◽  
Rare Earth ◽  
Ionic Conductivity ◽  
Bulk Material ◽  
Threshold Temperature ◽  
Doped Ceria ◽  
X Ray Diffraction ◽  
X Ray ◽  
Rare Earth Doped

Rare earth-doped ceria thin films are currently thoroughly studied to be used in miniaturized solid oxide cells, memristive devices and gas sensors. The employment in such different application fields derives from the most remarkable property of this material, namely ionic conductivity, occurring through the mobility of oxygen ions above a certain threshold temperature. This feature is in turn limited by the association of defects, which hinders the movement of ions through the lattice. In addition to these issues, ionic conductivity in thin films is dominated by the presence of the film/substrate interface, where a strain can arise as a consequence of lattice mismatch. A tensile strain, in particular, when not released through the occurrence of dislocations, enhances ionic conduction through the reduction of activation energy. Within this complex framework, high pressure X-ray diffraction investigations performed on the bulk material are of great help in estimating the bulk modulus of the material, and hence its compressibility, namely its tolerance toward the application of a compressive/tensile stress. In this review, an overview is given about the correlation between structure and transport properties in rare earth-doped ceria films, and the role of high pressure X-ray diffraction studies in the selection of the most proper compositions for the design of thin films.

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