Influence of Neodymium Content on Structural Properties and Electrical Characteristics of High-k NdTiO[sub 3] Gate Dielectrics

2008 ◽  
Vol 155 (4) ◽  
pp. G72 ◽  
Author(s):  
Tung-Ming Pan ◽  
Wei-Hao Shu
Keyword(s):  
Structural Properties ◽  
Gate Dielectrics ◽  
Electrical Characteristics ◽  
High K

Structural properties and electrical characteristics of high-k Dy2O3 gate dielectrics

2011 ◽  
Vol 257 (9) ◽  
pp. 3964-3968 ◽  
Author(s):  
Tung-Ming Pan ◽  
Wei-Tsung Chang ◽  
Fu-Chien Chiu
Keyword(s):  
Structural Properties ◽  
Gate Dielectrics ◽  
Electrical Characteristics ◽  
High K

Structural and Electrical Characteristics of High-k Sm[sub 2]TiO[sub 5] Gate Dielectrics

2009 ◽  
Vol 12 (6) ◽  
pp. G27 ◽  
Author(s):  
Tung-Ming Pan ◽  
Li-Chen Yen ◽  
Chun-Chin Huang ◽  
Wu-Ching Lin
Keyword(s):  
Gate Dielectrics ◽  
Electrical Characteristics ◽  
High K

Electrical and Structural Properties of Ternary Rare-Earth Oxides on Si and Higher Mobility Substrates and their Integration as High-k Gate Dielectrics in MOSFET Devices

2019 ◽  
Vol 35 (4) ◽  
pp. 461-479 ◽  
Author(s):  
J. Marcelo Lopes ◽  
Eylem Durğun Özben ◽  
Michael Schnee ◽  
Roman Luptak ◽  
Alexander Nichau ◽  
...  
Keyword(s):  
Rare Earth ◽  
Structural Properties ◽  
Gate Dielectrics ◽  
Rare Earth Oxides ◽  
High K

Structural Properties and Electrical Characteristics of High-κ Tm2O3 Gate Dielectrics for InGaZnO Thin Film Transistors

2014 ◽  
Vol 6 (9) ◽  
pp. 1973-1978
Author(s):  
Tung-Ming Pan ◽  
Fa-Hsyang Chen ◽  
Meng-Ning Hung ◽  
Jim-Long Her ◽  
Keiichi Koyama
Keyword(s):  
Thin Film ◽  
Structural Properties ◽  
Thin Film Transistors ◽  
Gate Dielectrics ◽  
Electrical Characteristics
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