Electrical Performance and Reliability Aspects of Strain Engineered Deep Submicron CMOS Technologies

Cor Claeys; Geert Eneman; Mireia Bargallo Gonzalez; Sofie Put; Eddy Simoen

doi:10.1149/1.2767280

Electrical Performance and Reliability Aspects of Strain Engineered Deep Submicron CMOS Technologies

ECS Transactions ◽

10.1149/1.2767280 ◽

2019 ◽

Vol 8 (1) ◽

pp. 15-22

Author(s):

Cor Claeys ◽

Geert Eneman ◽

Mireia Bargallo Gonzalez ◽

Sofie Put ◽

Eddy Simoen

Keyword(s):

Deep Submicron ◽

Electrical Performance ◽

Submicron Cmos

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Performance and reliability aspects of FOND: a new deep submicron CMOS device concept

IEEE Transactions on Electron Devices ◽

10.1109/16.535326 ◽

1996 ◽

Vol 43 (9) ◽

pp. 1407-1415 ◽

Cited By ~ 6

Author(s):

R. Bellens ◽

G. Van den Bosch ◽

P. Habas ◽

J.-P. Mieville ◽

G. Badenes ◽

...

Keyword(s):

Deep Submicron ◽

Submicron Cmos

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Sensing Design Issues in Deep Submicron CMOS SRAMs

IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design (ISVLSI'05) ◽

10.1109/isvlsi.2005.67 ◽

2005 ◽

Cited By ~ 4

Author(s):

A. Natarajan ◽

V. Shankar ◽

A. Maheshwari ◽

W. Burleson

Keyword(s):

Deep Submicron ◽

Design Issues ◽

Submicron Cmos

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Equivalent circuit models for stacked spiral inductors in deep submicron CMOS technology

Proceedings of the 2003 International Symposium on Circuits and Systems, 2003. ISCAS '03. ◽

10.1109/iscas.2003.1205682 ◽

2003 ◽

Author(s):

S.C. Rustagi ◽

Chun-Geik Tan

Keyword(s):

Equivalent Circuit ◽

Cmos Technology ◽

Deep Submicron ◽

Spiral Inductors ◽

Submicron Cmos ◽

Equivalent Circuit Models

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Bridging fault modeling and simulation for deep submicron CMOS ICs

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2002.800457 ◽

2002 ◽

Vol 21 (8) ◽

pp. 941-953 ◽

Cited By ~ 12

Author(s):

M. Favalli ◽

M. Dalpasso

Keyword(s):

Modeling And Simulation ◽

Fault Modeling ◽

Deep Submicron ◽

Bridging Fault ◽

Submicron Cmos

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TECHNOLOGY ROADMAP CHALLENGES FOR DEEP SUBMICRON CMOS

Microelectronics, Microsystems and Nanotechnology ◽

10.1142/9789812810861_0021 ◽

2001 ◽

Author(s):

C. L. CLAEYS ◽

H. E. MAES

Keyword(s):

Deep Submicron ◽

Technology Roadmap ◽

Submicron Cmos

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High-performance deep submicron CMOS technologies with polycrystalline-SiGe gates

IEEE Transactions on Electron Devices ◽

10.1109/16.831003 ◽

2000 ◽

Vol 47 (4) ◽

pp. 848-855 ◽

Cited By ~ 21

Author(s):

Y.V. Ponomarev ◽

P.A. Stolk ◽

C. Salm ◽

J. Schmitz ◽

P.H. Woerlee

Keyword(s):

High Performance ◽

Deep Submicron ◽

Submicron Cmos

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Analysis of the Flash ADC Bandwidth–Accuracy Tradeoff in Deep-Submicron CMOS Technologies

IEEE Transactions on Circuits & Systems II Express Briefs ◽

10.1109/tcsii.2008.2001979 ◽

2008 ◽

Vol 55 (10) ◽

pp. 1001-1005 ◽

Cited By ~ 8

Author(s):

Ayman Ismail ◽

Mohamed Elmasry

Keyword(s):

Deep Submicron ◽

Flash Adc ◽

Submicron Cmos ◽

Accuracy Tradeoff

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Study of SRAM Standby Leakage Reduction Techniques for Deep-submicron CMOS Technology

International Journal of Control and Automation ◽

10.14257/ijca.2017.10.10.05 ◽

2017 ◽

Vol 10 (10) ◽

pp. 49-62

Author(s):

Satyendra Kumar ◽

Kaushik Saha ◽

Hariom Gupta

Keyword(s):

Cmos Technology ◽

Deep Submicron ◽

Leakage Reduction ◽

Reduction Techniques ◽

Submicron Cmos

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Analytical semi-empirical model for SER sensitivity estimation of deep-submicron CMOS circuits

11th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2005.15 ◽

2005 ◽

Cited By ~ 27

Author(s):

T. Heijmen

Keyword(s):

Empirical Model ◽

Deep Submicron ◽

Cmos Circuits ◽

Sensitivity Estimation ◽

Submicron Cmos ◽

Semi Empirical

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Deep-Submicron CMOS ICs

10.1007/978-1-4615-4133-2 ◽

2000 ◽

Cited By ~ 21

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H. J. M. Veendrick

Keyword(s):

Deep Submicron ◽

Submicron Cmos

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