High-performance deep submicron CMOS technologies with polycrystalline-SiGe gates

Y.V. Ponomarev; P.A. Stolk; C. Salm; J. Schmitz; P.H. Woerlee

doi:10.1109/16.831003

High-performance deep submicron CMOS technologies with polycrystalline-SiGe gates

IEEE Transactions on Electron Devices ◽

10.1109/16.831003 ◽

2000 ◽

Vol 47 (4) ◽

pp. 848-855 ◽

Cited By ~ 21

Author(s):

Y.V. Ponomarev ◽

P.A. Stolk ◽

C. Salm ◽

J. Schmitz ◽

P.H. Woerlee

Keyword(s):

High Performance ◽

Deep Submicron ◽

Submicron Cmos

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Elevated source/drain by sacrificial selective epitaxy for high performance deep submicron CMOS: Process window versus complexity

IEEE Transactions on Electron Devices ◽

10.1109/16.848297 ◽

2000 ◽

Vol 47 (7) ◽

pp. 1484-1491 ◽

Cited By ~ 11

Author(s):

E. Augendre ◽

R. Rooyackers ◽

M. Caymax ◽

E.P. Vandamme ◽

A. De Keersgieter ◽

...

Keyword(s):

High Performance ◽

Deep Submicron ◽

Process Window ◽

Cmos Process ◽

Selective Epitaxy ◽

Submicron Cmos ◽

Elevated Source

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Deep-submicron CMOS design of high-performance low-power flash/folding analog-to-digital converters

Canadian Conference on Electrical and Computer Engineering 2004 (IEEE Cat. No.04CH37513) ◽

10.1109/ccece.2004.1349722 ◽

2004 ◽

Cited By ~ 1

Author(s):

J. Liobe ◽

M. Margala

Keyword(s):

Low Power ◽

High Performance ◽

Deep Submicron ◽

Analog To Digital Converters ◽

Analog To Digital ◽

Cmos Design ◽

Submicron Cmos

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Development of a Deep-Submicron CMOS Process for Fabrication of High Performance 0.25 μm Transistors

2006 16th Biennial University/Government/Industry Microelectronics Symposium ◽

10.1109/ugim.2006.4286345 ◽

2006 ◽

Author(s):

Michael Aquilino ◽

Lynn F. Fuller

Keyword(s):

High Performance ◽

Deep Submicron ◽

Cmos Process ◽

Submicron Cmos

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Deep-submicron CMOS technologies for low-power and high-performance operation

Electronics and Communications in Japan (Part II Electronics) ◽

10.1002/ecjb.4420791101 ◽

1996 ◽

Vol 79 (11) ◽

pp. 1-9 ◽

Cited By ~ 1

Author(s):

Manabu Deura ◽

Yasuo Nara ◽

Tatsuya Yamazaki ◽

Kenichi Gotoh ◽

Fumio Ohtake ◽

...

Keyword(s):

Low Power ◽

High Performance ◽

Deep Submicron ◽

Submicron Cmos

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FOND (Fully Overlapped Nitride-etch defined Device): a new device architecture for high-reliability and high-performance deep submicron CMOS technology

Proceedings of 1994 IEEE International Electron Devices Meeting ◽

10.1109/iedm.1994.383458 ◽

2002 ◽

Cited By ~ 2

Author(s):

J.-P. Mieville ◽

G. Van den Bosch ◽

L. Deferm ◽

R. Bellens ◽

G. Groeseneken ◽

...

Keyword(s):

High Performance ◽

High Reliability ◽

Cmos Technology ◽

Deep Submicron ◽

New Device ◽

Device Architecture ◽

Submicron Cmos

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An application of process synthesis methodology for first-pass fabrication success of high-performance deep-submicron CMOS

International Electron Devices Meeting. IEDM Technical Digest ◽

10.1109/iedm.1997.650283 ◽

2002 ◽

Cited By ~ 3

Author(s):

S. Saxena ◽

R. Burch ◽

K. Vasanth ◽

S. Rao ◽

C. Fernando ◽

...

Keyword(s):

High Performance ◽

Deep Submicron ◽

Process Synthesis ◽

First Pass ◽

Submicron Cmos ◽

Synthesis Methodology

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High performance and highly reliable deep submicron CMOSFETs using nitrided-oxide

1999 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.99CH36325) ◽

10.1109/vlsit.1999.799371 ◽

2003 ◽

Cited By ~ 1

Author(s):

K. Irino ◽

Y. Tamura ◽

S. Ohkubo ◽

T. Nakanishi ◽

M. Shigeno ◽

...

Keyword(s):

High Performance ◽

Deep Submicron

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Performance and reliability aspects of FOND: a new deep submicron CMOS device concept

IEEE Transactions on Electron Devices ◽

10.1109/16.535326 ◽

1996 ◽

Vol 43 (9) ◽

pp. 1407-1415 ◽

Cited By ~ 6

Author(s):

R. Bellens ◽

G. Van den Bosch ◽

P. Habas ◽

J.-P. Mieville ◽

G. Badenes ◽

...

Keyword(s):

Deep Submicron ◽

Submicron Cmos

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Sensing Design Issues in Deep Submicron CMOS SRAMs

IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design (ISVLSI'05) ◽

10.1109/isvlsi.2005.67 ◽

2005 ◽

Cited By ~ 4

Author(s):

A. Natarajan ◽

V. Shankar ◽

A. Maheshwari ◽

W. Burleson

Keyword(s):

Deep Submicron ◽

Design Issues ◽

Submicron Cmos

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Equivalent circuit models for stacked spiral inductors in deep submicron CMOS technology

Proceedings of the 2003 International Symposium on Circuits and Systems, 2003. ISCAS '03. ◽

10.1109/iscas.2003.1205682 ◽

2003 ◽

Author(s):

S.C. Rustagi ◽

Chun-Geik Tan

Keyword(s):

Equivalent Circuit ◽

Cmos Technology ◽

Deep Submicron ◽

Spiral Inductors ◽

Submicron Cmos ◽

Equivalent Circuit Models

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