Simple Method of Fabricating and Passivating High Power Pin Diodes

1978 ◽  
Vol 125 (4) ◽  
pp. 680-682 ◽  
Author(s):  
A. Rosen ◽  
G. A. Swartz ◽  
F. C. Duigon ◽  
A. M. Gombar
Keyword(s):  
1978 ◽  
Vol 9 (31) ◽  
Author(s):  
A. ROSEN ◽  
G. A. SWARTZ ◽  
F. C. DUIGON ◽  
A. M. GOMBAR
Keyword(s):  

2006 ◽  
Vol 50 (7-8) ◽  
pp. 1368-1370 ◽  
Author(s):  
Pavel A. Ivanov ◽  
Michael E. Levinshtein ◽  
John W. Palmour ◽  
Mrinal K. Das ◽  
Brett A. Hull

Author(s):  
MRINAL K. DAS ◽  
JOSEPH J. SUMAKERIS ◽  
BRETT A. HULL ◽  
JIM RICHMOND ◽  
SUMI KRISHNASWAMI ◽  
...  
Keyword(s):  

2021 ◽  
Author(s):  
Ming Liu ◽  
Rui Lu ◽  
Zhonghui Shen ◽  
Chunrui Ma ◽  
Tingzhi Duan ◽  
...  

Abstract High-performance dielectric capacitors are in high demand for advanced electronics and electric power systems. They possess high power density (on the order of Megawatt) and exhibit ultrafast charge/discharge capability (on a microsecond scale) and long-term storage lifetime1-5, and thus they are particularly demanded in pulse power systems such as high-power microwaves, hybrid electric vehicles, and high-frequency inverters. However, their relatively low operating temperature limits their widespread applications6-9. Here, guided by phase-field simulations, we synthesized capacitors with an energy storage density of 55.4 joules per cubic centimeter, energy efficiency of over 82%, and superior thermal stability and fatigue properties at record high operating temperature of 400°C. These ultrahigh-temperature performances are achieved through a relatively simple method of introduction and engineering of interfaces within the capacitors, which greatly improve their high-temperature stability, relaxation behavior, and breakdown strength. Our work not only successfully fabricated capacitors with potential applications in high-temperature electric power systems and electronic technologies but also opens up a promising and general route for designing high-performance electrostatic capacitors through interface engineering.


2008 ◽  
Vol 281 (14) ◽  
pp. 3762-3770 ◽  
Author(s):  
Gianluca Geloni ◽  
Evgeni Saldin ◽  
Evgeni Schneidmiller ◽  
Mikhail Yurkov

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