Ellipsometric Characterization of Si Surface Damage Induced by Sputter Etching

1983 ◽  
Vol 130 (5) ◽  
pp. 1201-1206 ◽  
Author(s):  
F. Ohira
Keyword(s):  
Surface Damage ◽  
Ellipsometric Characterization ◽  
Sputter Etching

Infrared ellipsometric characterization of SixNy films on textured Si photovoltaic cells

2008 ◽  
Author(s):  
Mario Fernando. Saenger ◽  
Martin Schädel ◽  
Tino Hofmann ◽  
James Hilfiker ◽  
Jianing Sun ◽  
...  
Keyword(s):  
Photovoltaic Cells ◽  
Ellipsometric Characterization

Ellipsometric characterization of thin films and superlattices

1990 ◽  
Vol 5 (2) ◽  
pp. 285-289 ◽  
Author(s):  
J. Bremer ◽  
O. Hunderi ◽  
Kong Fanping
Keyword(s):  
Thin Films ◽  
Ellipsometric Characterization

Tubing String Thread Sealing Surfaces Damage Evaluation Based on Acoustic Elasticity Theory

2019 ◽  
Vol 944 ◽  
pp. 828-834 ◽  
Author(s):  
Jian Jun Wang ◽  
Jian Hua Sun ◽  
Shang Yu Yang ◽  
Yao Rong Feng ◽  
Kai Lin
Keyword(s):  
Surface Roughness ◽  
Elasticity Theory ◽  
Contact Stress ◽  
Surface Characterization ◽  
Surface Damage ◽  
Center Frequency ◽  
Sealing Performance ◽  
Tubing String ◽  
Acoustic Elasticity

During the processing of tubing premium threaded made up, the degree of the thread sealing surface intactness will directly affect the sealing performance of the string. Nevertheless, there are some difficulties to detect the damage of the engaged sealing surface effectively. In the present study the sealing surface damage was judged by the sealing surface contact stress’s relative changes according to the acoustic elasticity theory,. At the same time, the wear defects generated at the tubing sealing surface, during the tubing made up, contrasted with the wear and unworn surface roughness of coupling ultrasonic detected about the sealing surface. The results showed that with the acoustic amplitude evaluated the sealing contact stress was susceptible to the influence of surface roughness of coupling. But the reflection wave with the center frequency on the sealing surface characterization of the contact stress could avoid this problem effectively.

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