Study of Impurity Profiles in Silicon

1983 ◽  
Vol 130 (12) ◽  
pp. 2502-2504 ◽  
Author(s):  
G. Eranna ◽  
D. Kakati
Keyword(s):  
Impurity Profiles

Estimation of impurity profiles of drugs and related materials

2002 ◽  
Vol 29 (6) ◽  
pp. 1153-1157 ◽  
Author(s):  
M Babják ◽  
G Balogh ◽  
M Gazdag ◽  
S Görög
Keyword(s):  
Impurity Profiles

Comparison of 105 Years of Oxygen Isotope and Insoluble Impurity Profiles from the Devon Island and Camp Century Ice Cores

1979 ◽  
Vol 11 (3) ◽  
pp. 299-305 ◽  
Author(s):  
David A. Fisher
Keyword(s):  
Oxygen Isotope ◽  
Flow Line ◽  
Ice Cores ◽  
Devon Island ◽  
Ice Cap ◽  
Particulate Concentration ◽  
The Difference ◽  
Impurity Profiles ◽  
Level Lowering ◽  
Present Site

Oxygen-isotope profiles for the Devon Island ice cap and Camp Century Greenland are affected by a number of variables, some of which must have been the same for both sites. The two δ(18O) records spanning about 120,000 years are brought into relative alignment by comparison of major δ features, and subsequent verification that the insoluble particulate concentration records were also in phase for this alignment. The difference between the δ profiles is shown to be mainly a function of the altitude of the accumulation area for Camp Century. This altitude seems to have been higher than present for the last 100,000 years, suggesting the present flow line through the site has never been shorter. The maximum altitude for the Camp Century accumulation area is 1500 m above the present site and is almost synchronous with the maximum in particulate concentration that occurs at 16,000 yr B.P. The synchronism is likely due to the maximum sea-level lowering that exposed vast areas of continental shelf to wind erosion.

scholarly journals Gyrokinetic modelling of stationary electron and impurity profiles in tokamaks

2014 ◽  
Vol 21 (9) ◽  
pp. 092305 ◽  
Author(s):  
A. Skyman ◽  
D. Tegnered ◽  
H. Nordman ◽  
P. Strand
Keyword(s):  
Impurity Profiles ◽  
Stationary Electron

Impurity profiles at the JET divertor targets compared with the DIVIMP code

1992 ◽  
Vol 196-198 ◽  
pp. 374-379 ◽  
Author(s):  
G.F. Matthews ◽  
P.C. Stangeby ◽  
J.D. Elder ◽  
N.A.C. Gottardi ◽  
P.J. Harbour ◽  
...  
Keyword(s):  
Impurity Profiles

Impurity Profiles in InP from Ion Implantation at Elevated Temperatures

1991 ◽  
Vol 240 ◽  
Author(s):  
P. Kringhoj ◽  
B. G. Svensson
Keyword(s):  
Mass Spectrometry ◽  
Ion Implantation ◽  
Elevated Temperatures ◽  
Secondary Ion Mass Spectrometry ◽  
Implantation Damage ◽  
Ion Mass Spectrometry ◽  
Chemical Profiles ◽  
Impurity Profiles ◽  
Secondary Ion

ABSTRACTThe chemical profiles of Zn, Ge, and Se implanted into InP at elevated temperatures have been measured with secondary ion mass spectrometry and correlated to the implantation damage as deduced from RBS/channeling measurements. An asymmetric broadening of the chemical profiles towards the bulk was found for implantation temperatures above 150°C. This effect is concluded to be due to impurity channeling during implantation.

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