Ion‐Beam Etching of InP and Its Application to the Fabrication of High Radiance InGaAsP / InP Light Emitting Diodes

1984 ◽  
Vol 131 (10) ◽  
pp. 2373-2380 ◽  
Author(s):  
Osamu Wada
Keyword(s):  
Light Emitting Diodes ◽  
Ion Beam ◽  
Ion Beam Etching ◽  
Light Emitting

Effect of Indium-Oxide Deposited Using an Oxygen Ion-Beam-Assisted-Deposition to Top-Emitting Organic Light-Emitting Diodes

2006 ◽  
Vol 45 (10B) ◽  
pp. 8457-8461 ◽  
Author(s):  
Chang Hyun Jeong ◽  
Jong Tae Lim ◽  
June Hee Lee ◽  
Mi Suk Kim ◽  
Jeong Woon Bae ◽  
...  
Keyword(s):  
Indium Oxide ◽  
Light Emitting Diodes ◽  
Ion Beam ◽  
Organic Light Emitting Diodes ◽  
Light Emitting ◽  
Oxygen Ion ◽  
Ion Beam Assisted Deposition ◽  
Organic Light

Focused ion beam nano patterning for fabrications of III-nitride light emitting diodes

2007 ◽  
Author(s):  
M. Y. Kim ◽  
Y. C. Park ◽  
S. S. Hong ◽  
B. K. Kim ◽  
D. W. Kim ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Light Emitting Diodes ◽  
Ion Beam ◽  
Light Emitting ◽  
Nano Patterning

Optical and Electrical Properties of µ-Slice InGaN/GaN Light Emitting Diodes Shaped by Focused Ion Beam Process

2011 ◽  
Vol 4 (3) ◽  
pp. 032104 ◽  
Author(s):  
Che-Kang Hsu ◽  
Jinn-Kong Sheu ◽  
Jia-Kuen Wang ◽  
Ming-Lun Lee ◽  
Kuo-Hua Chang ◽  
...  
Keyword(s):  
Electrical Properties ◽  
Focused Ion Beam ◽  
Light Emitting Diodes ◽  
Ion Beam ◽  
Optical And Electrical Properties ◽  
Light Emitting

Ion beam fabricated silicon light emitting diodes

2004 ◽  
Vol 201 (2) ◽  
pp. 239-244 ◽  
Author(s):  
M. A. Louren�o ◽  
M. S. A. Siddiqui ◽  
G. Shao ◽  
R. M. Gwilliam ◽  
K. P. Homewood
Keyword(s):  
Light Emitting Diodes ◽  
Ion Beam ◽  
Light Emitting

Failure Mechanisms of Contact Vias in Organic Light Emitting Diode Displays

2004 ◽  
Author(s):  
T.D. Lowes ◽  
L. Wu ◽  
K. Eden ◽  
J. Trujillo
Keyword(s):  
Focused Ion Beam ◽  
Light Emitting Diode ◽  
Ion Beam ◽  
Electrical Performance ◽  
Ion Beam Etching ◽  
Light Emitting ◽  
Organic Light Emitting Diode ◽  
Root Cause ◽  
Organic Light ◽  
Secondary Ion

Abstract A new via interconnect failure mode found in organic light emitting diode (OLED) displays has been documented. Physical appearance, electrical performance, response to environmental stresses and root cause analyses have been studied using both simplistic and sophisticated failure analysis tools including focused ion beam etching and time of flight secondary ion mass spectroscopy (TOF-SIMS).

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