Investigation of Leakage Currents in a Zinc Borosilicate Glass Passivated p‐n Junction Using a Gate‐Controlled Diode
1985 ◽
Vol 132
(9)
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pp. 2198-2201
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2009 ◽
Vol 46
(6)
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pp. 609-614
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1981 ◽
Vol 128
(3)
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pp. 614-616
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1974 ◽
Vol 57
(3)
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pp. 149-149
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1992 ◽
Vol 139
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pp. 185-197
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Keyword(s):
2017 ◽
Vol 9
(1)
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pp. 99-104
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