Silicon Dioxide with a Silicon Interfacial Layer as an Insulating Gate For Highly Stable Indium Phosphide Metal‐Insulator‐Semiconductor Field Effect Transistors
1991 ◽
Vol 138
(6)
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pp. 1788-1794
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2017 ◽
pp. 217-232
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Keyword(s):
2019 ◽
Vol 7
(29)
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pp. 8855-8860
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Keyword(s):
Keyword(s):