Thermal Stability of Cu / CoSi2 Contacted p+n Shallow Junction with and without TiW Diffusion Barrier
1994 ◽
Vol 141
(10)
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pp. 2804-2810
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2003 ◽
Vol 32
(8)
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pp. 890-898
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Keyword(s):
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1999 ◽
Vol 38
(Part 1, No. 3A)
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pp. 1343-1351
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2013 ◽
Vol 31
(2)
◽
pp. 022205
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2004 ◽
Vol 43
(9A)
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pp. 5997-6000
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