Temperature-Dependent Characteristics of InGaP∕InGaAs∕GaAs High-Electron Mobility Transistor Measured between 77 and 470 K
2005 ◽
Vol 152
(10)
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pp. G778
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2009 ◽
Vol 24
(3)
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pp. 035013
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2006 ◽
Vol 153
(7)
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pp. G632
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2005 ◽
2008 ◽
Vol 23
(12)
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pp. 125041
2008 ◽
Vol 155
(12)
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pp. H995
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