In Situ X‐Ray Diffraction of Lithium Intercalation in Nanostructured and Thin Film Anatase TiO2

1999 ◽  
Vol 146 (9) ◽  
pp. 3150-3154 ◽  
Author(s):  
Roel van de Krol ◽  
Albert Goossens ◽  
Eric A. Meulenkamp
Keyword(s):  
Thin Film ◽  
Anatase Tio2 ◽  
Lithium Intercalation ◽  
X Ray Diffraction ◽  
X Ray

In-Situ X-ray Diffraction Study of Lithium Intercalation in Nanostructured Anatase Titanium dioxide

1998 ◽  
Vol 536 ◽  
Author(s):  
R. Van de Krol ◽  
E. A. Meulenkamp ◽  
A. Goossens ◽  
J. Schoonman
Keyword(s):  
Phase Transformation ◽  
Maximum Amount ◽  
Lithium Intercalation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Before And After ◽  
The Difference ◽  
Two Phases ◽  
Reversible Phase

AbstractElectrochemical lithium intercalation in nanostructured anatase TiO2 is investigated with in-situ X-ray diffraction. A complete and reversible phase transformation from tetragonal anatase TiO2 to orthorhombic anatase Li0.5TiO2 is observed. The difference of the XRD spectra before and after insertion can be fitted with the lattice parameters of the two phases as fit parameters. The maximum amount of lithium that can be dissolved in anatase TiO2 before the phase transformation occurs is found to be very small.

Electromechanical Properties of Pb(Mg1/3Nb2/3)O3 Thin Film Capacitors

1998 ◽  
Vol 541 ◽  
Author(s):  
G. Catalan ◽  
M.H. Corbett ◽  
R.M. Bowman ◽  
J.M. Gregg
Keyword(s):  
Thin Film ◽  
Compressive Strain ◽  
X Ray Diffraction ◽  
Leakage Currents ◽  
Plan View ◽  
X Ray ◽  
Thin Film Capacitors ◽  
Transmission Electron ◽  
Tensile Strains

AbstractPulsed Laser Deposition was used to grow Pb(Mg1/3Nb2/3)O3 (PMN) thin film planar capacitor structures. PMN crystallography was verified by x-ray diffraction and plan-view Transmission Electron Microscopy (TEM). Capacitance of the thin film structures was measured as a function of temperature and frequency. Leakage current was also measured for each capacitor. A DC field was subsequently applied and crystallographic strain was monitored in-situ by X-ray diffraction. The electromechanical strain was found to strongly depend on the deposition conditions for each capacitor. Tensile strains of ∼0.2% and compressive strains of ∼0.3% parallel to the applied field were measured for capacitors of different oxygen contents and thicknesses. We propose that the compressive strain is caused by the combined effect of joule heating of the capacitor structure, caused by large leakage currents, and epitaxial coupling between substrate and films. Electrostrictive tensile strains are of the same order as observed inbulk.

In situ high temperature X-ray diffraction studies of ZnO thin film

2011 ◽  
Vol 20 (9) ◽  
pp. 096102 ◽  
Author(s):  
Xiang-Cun Chen ◽  
Jie-Ping Zhou ◽  
Hai-Yang Wang ◽  
Peng-Shou Xu ◽  
Guo-Qiang Pan
Keyword(s):  
Thin Film ◽  
High Temperature ◽  
Zno Thin Film ◽  
X Ray Diffraction ◽  
X Ray

In situ X-ray Investigation of Hydrogen Charging in Thin Film Bimetallic Electrodes

1997 ◽  
Vol 12 (8) ◽  
pp. 2091-2098 ◽  
Author(s):  
Najeh M. Jisrawi ◽  
Harold Wiesmann ◽  
M. W. Ruckman ◽  
T. R. Thurston ◽  
G. Reisfeld ◽  
...  
Keyword(s):  
Thin Film ◽  
Cyclic Voltammetry ◽  
Hydrogen Uptake ◽  
Metallic Films ◽  
X Ray Diffraction ◽  
Cell Potential ◽  
Multilayered Thin Film ◽  
X Ray ◽  
Multilayer Electrode

Hydrogen uptake and discharge by thin metallic films under potentiostatic control was studied using x-ray diffraction at the National Synchroton Light Source (NSLS). The formation of metal-hydrogen phases in Pd, Pd-capped Nb, and Pd/Nb multilayer electrode structures was deduced from x-ray diffraction data and correlated with the cyclic voltammetry (CV) peaks. The x-ray data were also used to construct a plot of the hydrogen concentration as a function of cell potential for a multilayered thin film.

In-situ study of Ni–Ti thin film growth on a TiN intermediate layer by X-ray diffraction

2007 ◽  
Vol 126 (1) ◽  
pp. 332-337 ◽  
Author(s):  
R MARTINS ◽  
N SCHELL ◽  
R SILVA ◽  
L PEREIRA ◽  
K MAHESH ◽  
...  
Keyword(s):  
Thin Film ◽  
Intermediate Layer ◽  
Film Growth ◽  
Thin Film Growth ◽  
X Ray Diffraction ◽  
X Ray ◽  
In Situ Study

In situ structural analysis of BPDA-PPD polyimide thin film using two-dimensional grazing incidence X-ray diffraction

2008 ◽  
Vol 23 (2) ◽  
pp. 109-112 ◽  
Author(s):  
J. Kikuma ◽  
T. Nayuki ◽  
T. Ishikawa ◽  
S. Matsuno ◽  
G. Asano
Keyword(s):  
Thin Film ◽  
Grazing Incidence ◽  
Molecular Chain ◽  
Curing Temperature ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
Cooling Process ◽  
X Ray ◽  
Plane Direction

Structural development of BPDA-PPD polyimide thin film has been investigated by in situ grazing incidence X-ray diffraction at the BL24XU beamline of the SPring-8. Optimizing the sample shape, two-dimensional images were measured successfully without sacrificing angle resolution. It has been clearly shown that the crystallization first begins in the in-plane direction, at the curing temperature of 180 °C, in which the periodic structure of the molecular chain axis (c axis) is developed. The crystallization in the surface normal (out-of-plane) direction is observed later, at the curing temperature above 300 °C. A slight increase of the d spacing of the c axis during heating process has been observed, suggesting the stretching of the contracted molecular chain in accordance with the curing process. In the cooling process, the decrease of the d spacings for a and b axes was considerable, which indicates thermal expansion of the crystals at high temperatures. The increases in the peak intensities during the cooling process have been observed, which indicate the d spacing of each axis becomes close to the equilibrium value to produce higher periodicity.

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