Selective Deposition of Thin Copper Films onto Silicon with Improved Adhesion

2001 ◽  
Vol 4 (1) ◽  
pp. C5 ◽  
Author(s):  
L. Magagnin ◽  
R. Maboudian ◽  
C. Carraro
1992 ◽  
Vol 282 ◽  
Author(s):  
John A. T. Norman ◽  
David A. Roberts ◽  
Arthur K. Hochberg

ABSTRACTThe selectivity of OMCVD copper films grown at 160°C/500 mTorr from the volatile liquid precursor Cu(hfac)tmvs was evaluated for various commercial 6” wafers patterned with either TiN/SiO2 or TiN/Si3N4. By processing wafers “as received”, only thermal grown SiO2 consistently resisted metallization, allowing copper films up to 1.5μ thick to be grown on TiN. For SiO2, films containing H2O, especially from PECVD, only blanket deposition was observed. However, by a utilizing simple thermal predeposition dehydration some of these SiO2 films were conditioned to give selective deposition.


ChemInform ◽  
2001 ◽  
Vol 32 (17) ◽  
pp. no-no
Author(s):  
L. Magagnin ◽  
R. Maboudian ◽  
C. Carraro

2020 ◽  
Vol 7 (1) ◽  
pp. 143-148 ◽  
Author(s):  
Silvia Varagnolo ◽  
Jaemin Lee ◽  
Houari Amari ◽  
Ross A. Hatton

Patterning evaporated silver and copper films without metal removal using extremely thin printed organofluorine films to modulate metal vapour condensation.


2020 ◽  
Vol 56 (8) ◽  
pp. 1275-1278 ◽  
Author(s):  
Zhe She ◽  
Mina R. Narouz ◽  
Christene A. Smith ◽  
Amy MacLean ◽  
Hans-Peter Loock ◽  
...  

Creating N-heterocyclic carbene and thiol micropatterns for electrochemical fabrication of copper micro-structures.


1997 ◽  
Vol 1 (1) ◽  
pp. 225-238
Author(s):  
M. Wünsche ◽  
H. Meyer ◽  
R. Schumacher ◽  
S. Wasle ◽  
K. Doblhofer

2003 ◽  
Vol 766 ◽  
Author(s):  
Kosuke Takenaka ◽  
Masao Onishi ◽  
Manabu Takenshita ◽  
Toshio Kinoshita ◽  
Kazunori Koga ◽  
...  

AbstractAn ion-assisted chemical vapor deposition method by which Cu is deposited preferentially from the bottom of trenches (anisotropic CVD) has been proposed in order to fill small via holes and trenches. By using Ar + H2 + C2H5OH[Cu(hfac)2] discharges with a ratio H2 / (H2 + Ar) = 83%, Cu is filled preferentially from the bottom of trenches without deposition on the sidewall and top surfaces. The deposition rate on the bottom surface of trenches is experimentally found to increase with decreasing its width.


1988 ◽  
Vol 18 (3) ◽  
pp. 332-337 ◽  
Author(s):  
KAZUE TAZAKI ◽  
W. S. FYFE ◽  
KOICHI TAZAKI ◽  
J. BISCHOFF ◽  
B. R. ROCHA

2020 ◽  
Author(s):  
I-Hsin Tseng ◽  
Yun-Ting Hsu ◽  
Jihperng Leu ◽  
K. N. Tu ◽  
Chih Chen

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