Proton Conductivity and Oriented Structure of Nafion Thin Films on the Au-Deposited Surface and MgO Substrate

2018 ◽  
Vol 88 (1) ◽  
pp. 249-258
Author(s):  
Yuki Nagao ◽  
Aoi Enta ◽  
Athchaya Suwansoontorn ◽  
Yutaro Ono
Keyword(s):  
Thin Films ◽  
Proton Conductivity ◽  
Oriented Structure ◽  
Mgo Substrate

Electron Microscopy Studies of The Chemistry And Microstructure of BaF2 / YBa2Cu3O7-x Thin Films

1994 ◽  
Vol 52 ◽  
pp. 796-797
Author(s):  
J. L. Lee ◽  
C. A. Weiss ◽  
R. A. Buhrman ◽  
J. Silcox
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Transmission Electron Microscope ◽  
Atomic Scale ◽  
Island Growth ◽  
Multilayer Systems ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Mgo Substrate

BaF2 thin films are being investigated as candidates for use in YBa2Cu3O7-x (YBCO) / BaF2 thin film multilayer systems, given the favorable dielectric properties of BaF2. In this study, the microstructural and chemical compatibility of BaF2 thin films with YBCO thin films is examined using transmission electron microscopy and microanalysis. The specimen was prepared by using laser ablation to first deposit an approximately 2500 Å thick (0 0 1) YBCO thin film onto a (0 0 1) MgO substrate. An approximately 7500 Å thick (0 0 1) BaF2 thin film was subsequendy thermally evaporated onto the YBCO film.Images from a VG HB501A UHV scanning transmission electron microscope (STEM) operating at 100 kV show that the thickness of the BaF2 film is rather uniform, with the BaF2/YBCO interface being quite flat. Relatively few intrinsic defects, such as hillocks and depressions, were evident in the BaF2 film. Moreover, the hillocks and depressions appear to be faceted along {111} planes, suggesting that the surface is smooth and well-ordered on an atomic scale and that an island growth mechanism is involved in the evolution of the BaF2 film.

Proton Conductivity of Niobium Phosphate Glass Thin Films

2018 ◽  
Vol 28 (5) ◽  
pp. 308-314
Author(s):  
Dae Ho Kim ◽  
Sung Bum Park ◽  
Yong-il Park
Keyword(s):  
Thin Films ◽  
Proton Conductivity ◽  
Phosphate Glass ◽  
Niobium Phosphate

scholarly journals Переключение поляризации вдоль подложки в тонких пленках Bi-=SUB=-4-=/SUB=-Ti-=SUB=-3-=/SUB=-O-=SUB=-12-=/SUB=- при различных деформационных напряжениях

2020 ◽  
Vol 90 (1) ◽  
pp. 128
Author(s):  
В.М. Мухортов ◽  
Д.В. Стрюков ◽  
С.В. Бирюков ◽  
Ю.И. Головко
Keyword(s):  
Thin Films ◽  
Film Thickness ◽  
Domain Structure ◽  
Spontaneous Polarization ◽  
Unit Cell ◽  
Interface Plane ◽  
Dielectric Characteristics ◽  
Unit Cells ◽  
Mgo Substrate

A study of epitaxial Bi4Ti3O12 thin films with a pre-deposited 4 nm Ba0.4Sr0.6TiO3 sublay-er on (001) MgO substrates has been performed. In the obtained heterostructures, the rotation of the Bi4Ti3O12 film unit cells by an angle of 45° relative to the MgO substrate unit cell in the inter-face plane has been observed. The Bi4Ti3O12 films contain unit cell deformations depending on the thickness of the film and the sign of the deformation changes at a thickness of ~40 nm. The switchable in-plane spontaneous polarization of Bi4Ti3O12 film at the 180° domain structure oc-curs at a film thickness of 10 nm and increases with a thickness up to 54 µC/cm2. The study of the dielectric characteristics of the films confirmed the existence of properties anisotropy in the interface plane and the effect of deformation of the unit cell on the properties of heterostruc-tures.

Dielectric and Room Temperature Tunable Properties of Mg-doped Ba0.96Ca0.04Ti0.84Zr0.16O3 Thin Films on Pt/MgO

2002 ◽  
Vol 720 ◽  
Author(s):  
T.S. Kalkur ◽  
Woo-Chul Yi ◽  
Elliott Philofsky ◽  
Lee Kammerdine
Keyword(s):  
Thin Films ◽  
Bottom Electrode ◽  
Dissipation Factor ◽  
X Ray Diffraction ◽  
Electrical Measurements ◽  
X Ray ◽  
High Tunability ◽  
High Dielectric ◽  
Mgo Substrate ◽  
Mg Doped

AbstractMg- doped Ba0.96 Ca0.04 Ti0.84Zr0.16O3 (BCTZ) thin films were fabricated on Pt/MgO substrate by metallorganic decomposition method. The structure of the films were analyzed by x-ray diffraction. The electrical measurements were performed on metal-ferroelectric-metal capacitors with platinum as the top and bottom electrode. The dielectric properties were improved after the capacitors were post annealed at 700 °C in oxygen atmosphere for 30 min. A high dielectric constant of 504 and a dissipation factor of less than 4% was obtained at 1 MHz. The Pt/BCTZ/Pt/MgO capacitors exhibited high tunability of 55% at an applied field of 55 kV/cm.

Characterization of spray-pyrolized superconducting YBaCuO thin films on single-crystal MgO by transmission electron microscopy

1990 ◽  
Vol 5 (8) ◽  
pp. 1605-1611 ◽  
Author(s):  
S. J. Golden ◽  
H. Isotalo ◽  
M. Lanham ◽  
J. Mayer ◽  
F. F. Lange ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Film Thickness ◽  
Single Crystal ◽  
Processing Parameters ◽  
Transmission Electron ◽  
Film Substrate ◽  
Mgo Substrate

Superconducting YBaCuO thin films have been fabricated on single-crystal MgO by the spray-pyrolysis of nitrate precursors. The effects on the superconductive behavior of processing parameters such as time and temperature of heat treatment and film thickness were investigated. The superconductive behavior was found to be strongly dependent on film thickness. Films of thickness 1 μm were found to have a Tc of 67 K while thinner films showed appreciably degraded properties. Transmission electron microscopy studies have shown that the heat treatments necessary for the formation of the superconductive phase (for example, 950 °C for 30 min) also cause a substantial degree of film-substrate interdiffusion. Diffusion distances for Cu in the MgO substrate and Mg in the film were found to be sufficient to explain the degradation of the superconductive behavior in films of thickness 0.5 μm and 0.2 μm. From the concentration profiles obtained by EDS analysis diffusion coefficients at 950 °C for Mg into the YBaCuO thin film and for Cu into the MgO substrate were evaluated as 3 × 10−19 m2/s and 1 × 10−17 m2/s, respectively.

Two-Dimensional Modulated Interfacial Structures of Highly Epitaxial Ferromagnetic (La,Ca)MnO3 and Ferroelectric (Pb,Sr)TiO3 Thin Films on (001) MgO

2008 ◽  
Vol 3 ◽  
pp. 59-66 ◽  
Author(s):  
Jiechao Jiang ◽  
J. He ◽  
Efstathios I. Meletis ◽  
Jian Liu ◽  
Z. Yuan ◽  
...  
Keyword(s):  
Thin Films ◽  
Cross Section ◽  
Lattice Mismatch ◽  
Rock Type ◽  
Two Dimensional ◽  
Salt Rock ◽  
Double Diffraction ◽  
Tem Analysis ◽  
Plan View ◽  
Mgo Substrate

Two-dimensional in-plane interface structures of highly epitaxial perovskite (La,Ca)MnO3 (LCMO) and (Pb,Sr)TiO3 (PSTO) thin films on salt-rock type MgO substrate were studied using Transmission Electron Microscopy (TEM). Cross-section TEM studies revealed that both LCMO and PSTO films are good single crystal quality and have atomic sharp interface with respect to the MgO substrate with -6.4% and -6.2% lattice mismatch, respectively. Electron Diffraction Patterns (EDPs) of plan-view LCMO/MgO and PSTO/MgO interfaces exhibit double diffraction spots. An analytical approach was employed using double diffraction to study the two-dimensional in-plane interfaces of perovskite structure films on the salt-rock type substrate. The lattice mismatch near the interface regions was determined using EDPs of the plan-view interfaces and found to be -8.0% for LCMO/MgO and -7.14% for PSTO. Both latter values are larger than those obtained using cross-section TEM. Studies of the sharpness of double diffraction spots and plan-view high resolution (HR) TEM brought a conclusion that the PSTO film is well commensurate with the MgO substrate over large areas, whereas LCMO film is only locally commensurate with the substrate. These studies provide additional evidence to our previous observations that plan-view TEM of the interface is able to provide critical and valuable information that is lacking from the cross-section TEM analysis.

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