Rearrangement of Fringing Field by Sidewall Passivated Metal Gate in MIS Tunnel Diode
2015 ◽
Vol 54
(6S1)
◽
pp. 06FG10
◽
Keyword(s):
1969 ◽
Vol 116
(10)
◽
pp. 1628
1984 ◽
Vol 45
(C1)
◽
pp. C1-889-C1-892
Keyword(s):
2021 ◽
Vol E104.C
(1)
◽
pp. 40-43
Keyword(s):
2005 ◽
Vol 8
(12)
◽
pp. G333
◽