Changes in SOFC Cathode Crystallographic Structure Induced by Temperature, Potential and Oxygen Partial Pressure Studied Using in-Situ HT-XRD
1994 ◽
Vol 68-69
◽
pp. 279-284
◽
1991 ◽
Vol 6
(10)
◽
pp. 2054-2058
◽
2005 ◽
Vol 20
(10)
◽
pp. 2745-2753
◽
1994 ◽
Vol 33
(Part 2, No. 5B)
◽
pp. L718-L721
◽
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