In situ characterization of strontium surface segregation in epitaxial La0.7Sr0.3MnO3 thin films as a function of oxygen partial pressure

2008 ◽  
Vol 93 (15) ◽  
pp. 151904 ◽  
Author(s):  
Tim T. Fister ◽  
Dillon D. Fong ◽  
Jeffrey A. Eastman ◽  
Peter M. Baldo ◽  
Matthew J. Highland ◽  
...  
Keyword(s):  
Thin Films ◽  
Oxygen Partial Pressure ◽  
Partial Pressure ◽  
Surface Segregation ◽  
In Situ Characterization

Characterization of YBa2Cu4O8 high temperature electrical properties and thermodynamic stability

1991 ◽  
Vol 6 (10) ◽  
pp. 2054-2058 ◽  
Author(s):  
B-S. Hong ◽  
T.O. Mason
Keyword(s):  
High Temperature ◽  
Electrical Property ◽  
Electrical Properties ◽  
Seebeck Coefficient ◽  
Oxygen Partial Pressure ◽  
Partial Pressure ◽  
Pressure Range ◽  
Stability Range

Via in situ electrical property measurements (conductivity, Seebeck coefficient) over the temperature range 500–800 °C and oxygen partial pressure range 10−4-1 atm, the equilibrium transport properties and stability range of YBa2Cu4O8 were determined. YBa2Cu4O8 behaves like the intrinsically mixed-valent compound, magnetite (Fe3O4), with small variations in electrical properties with changes in oxygen partial pressure. The decomposition boundary to YBa2Cu3O6+y (or YBa2Cu3.5O7.5±z) and CuO occurs at log(po2, atm) = −1.24 × 104/T(K) + 11.01(773 ⋚ T(K) ⋚ 1073).

In Situ Deposition of YBCO Thin Films by Sputtering under Low Oxygen Partial Pressure

1994 ◽  
Vol 33 (Part 2, No. 5B) ◽  
pp. L718-L721 ◽  
Author(s):  
Yong Ki Park ◽  
Keunseop Park ◽  
Soon-Gul Lee ◽  
Dong Chan Shin ◽  
Jong-Chul Park
Keyword(s):  
Thin Films ◽  
Oxygen Partial Pressure ◽  
Partial Pressure ◽  
Low Oxygen ◽  
Ybco Thin Films ◽  
In Situ Deposition

In situ characterization of sputtered thin films using a normal incidence laser reflectometer

1992 ◽  
Vol 10 (4) ◽  
pp. 939-944 ◽  
Author(s):  
Dubravko I. Babić ◽  
Thomas E. Reynolds ◽  
Evelyn L. Hu ◽  
John E. Bowers
Keyword(s):  
Thin Films ◽  
Normal Incidence ◽  
In Situ Characterization

UHV-preparation and in situ characterization of magneto-optical thin films

1988 ◽  
Vol 24 (2) ◽  
pp. 1731-1733 ◽  
Author(s):  
D. Weller ◽  
P. Schrijner ◽  
W. Reim
Keyword(s):  
Thin Films ◽  
In Situ Characterization

CVD elaboration and in situ characterization of barium silicate thin films

2010 ◽  
Vol 30 (2) ◽  
pp. 441-446 ◽  
Author(s):  
Thomas Genevès ◽  
Luc Imhoff ◽  
Bruno Domenichini ◽  
Paul Maurice Peterlé ◽  
Sylvie Bourgeois
Keyword(s):  
Thin Films ◽  
In Situ Characterization ◽  
Barium Silicate
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