(Invited) Investigation of Frenkel-Pair Formation in HfO2 and Its Influence on OxRAM Memory Reliability

2014 ◽  
Vol 64 (8) ◽  
pp. 141-146
Author(s):  
E. Vianello ◽  
P. Blaise ◽  
B. Traore ◽  
K. Xue ◽  
L. Fonseca ◽  
...  
Keyword(s):  
2018 ◽  
Vol 98 (17) ◽  
Author(s):  
Thomas A. Mellan ◽  
Andrew I. Duff ◽  
Michael W. Finnis

1969 ◽  
Vol 29 (4) ◽  
pp. 174-175 ◽  
Author(s):  
F. Maury ◽  
A. Lucasson ◽  
P. Lucasson
Keyword(s):  

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