scholarly journals Palladium-Coated and Bare Copper Wire Study for Ultra-Fine Pitch Wire Bonding

2013 ◽  
Vol 52 (1) ◽  
pp. 717-730 ◽  
Author(s):  
A. B. Y. Lim ◽  
A. C. K. Chang ◽  
C. X. Lee ◽  
O. Yauw ◽  
B. Chylak ◽  
...  
Keyword(s):  
Copper Wire ◽  
Wire Bonding ◽  
Fine Pitch ◽  
Bare Copper

Fine pitch copper wire bonding on 45nm tech Cu/low-k chip with different bond pad metallurgy

2011 ◽  
Author(s):  
Leong Ching Wai ◽  
Norhanani Binte Jaafar ◽  
Michelle Chew ◽  
Sivakumar ◽  
Gunasekaran ◽  
...  
Keyword(s):  
Copper Wire ◽  
Wire Bonding ◽  
Fine Pitch ◽  
Copper Wire Bonding ◽  
Low K

Fine Pitch Cu Wire Bonding – As Good As Gold

2010 ◽  
Vol 2010 (1) ◽  
pp. 000650-000655
Author(s):  
Bernd K. Appelt ◽  
William T. Chen ◽  
Andy Tseng ◽  
Yi-Shao Lai
Keyword(s):  
Raw Materials ◽  
Copper Wire ◽  
Commodity Prices ◽  
Gold Wire ◽  
Wire Bonding ◽  
Fine Pitch ◽  
Methodical Approach ◽  
Copper Wire Bonding ◽  
Gold Wires ◽  
The Impact

Fine pitch wire bonding has traditionally been the domain of gold wires. The significant increase in gold commodity prices has driven a continuous reduction in wire diameters to minimize the impact of the raw materials cost of the wire. This has reached a point now where copper wires are beginning to displace gold wires despite the technical challenges associated with copper wires. The basic challenges like propensity for oxidation, hardness and propensity for corrosion can be managed with the appropriate investment in tooling and infrastructure. Doubts are persisting about yield and reliability. With a very methodical approach to developing the process controls, it can be demonstrated that yields are as good as those for gold despite the fact that copper bonds are not reworkable. Likewise, the typical JEDEC reliability tests can be full filled. Here, an extensive effort has been placed on extended JEDEC testing to demonstrate that with good process control and proper materials choices, test durations of more than 2x can be passed. This excellent performance demonstrates that copper wire bonding can be as good as or better than gold wire bonding.

The Microelectronic Wire Bond: Past, Present, and Future

2010 ◽  
Vol 2010 (1) ◽  
pp. 000462-000469
Author(s):  
Harry K. Charles
Keyword(s):  
Copper Wire ◽  
Low Cost ◽  
Bond Formation ◽  
Wire Bonding ◽  
Testing Methods ◽  
Wire Bond ◽  
Fine Pitch ◽  
Wire Bonds ◽  
Ball Bonding

Since its very inception, the microelectronic wire bond has been the dominate form of first-level interconnection (chip to package or substrate). Wire bonds account for over 80% of first-level chip interconnections made by the microelectronic industry each year. Wire bonding is reliable, flexible, and low cost when compared to other forms of first-level interconnections. In this article a brief discussion of wire bonding is presented along with bond formation fundamentals. Aspects of wire bond reliability will be explored in conjunction with methods of wire bond testing. Particular attention is given to fine pitch bonding, bonding to stacked die, higher frequency bonding, ball bonding with copper wire, and advanced bond testing methods.

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