Study of the Vth shift of the thin-film transistor by the bias temperature stress test

1992 ◽  
Vol 36 (1) ◽  
pp. 76-82 ◽  
Author(s):  
Y. Fujimoto
Keyword(s):  
Thin Film ◽  
Temperature Stress ◽  
Stress Test ◽  
Thin Film Transistor ◽  
Bias Temperature Stress

Abnormal double-hump phenomenon in amorphous In-Ga-Zn-O thin-film transistor under positive gate bias temperature stress

2020 ◽  
Vol 172 ◽  
pp. 107875
Author(s):  
Yongjo Kim ◽  
Tae-Kyoung Ha ◽  
SangHee Yu ◽  
GwangTae Kim ◽  
Hoon Jeong ◽  
...  
Keyword(s):  
Thin Film ◽  
Temperature Stress ◽  
Thin Film Transistor ◽  
Gate Bias ◽  
Bias Temperature Stress

Hydrogen as a Cause of Abnormal Subchannel Formation Under Positive Bias Temperature Stress in a-InGaZnO Thin-Film Transistors

2019 ◽  
Vol 66 (7) ◽  
pp. 2954-2959
Author(s):  
Yu-Chieh Chien ◽  
Yi-Chieh Yang ◽  
Yu-Ching Tsao ◽  
Hsiao-Cheng Chiang ◽  
Mao-Chou Tai ◽  
...  
Keyword(s):  
Thin Film ◽  
Temperature Stress ◽  
Thin Film Transistors ◽  
Positive Bias ◽  
Bias Temperature Stress

Investigation of the instability of low-temperature poly-silicon thin film transistors under a negative bias temperature stress

2013 ◽  
Vol 9 (S1) ◽  
pp. 13-16 ◽  
Author(s):  
Yu-Mi Kim ◽  
Kwang-Seok Jeong ◽  
Ho-Jin Yun ◽  
Seung-Dong Yang ◽  
Sang-Youl Lee ◽  
...  
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Temperature Stress ◽  
Thin Film Transistors ◽  
Negative Bias ◽  
Silicon Thin Film ◽  
Poly Silicon ◽  
Bias Temperature Stress
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