Accelerated transition fault simulation

1987 ◽  
Author(s):  
M. H. Schultz ◽  
F. Brglez
Keyword(s):  
Fault Simulation ◽  
Transition Fault

Transition Fault Simulation

1987 ◽  
Vol 4 (2) ◽  
pp. 32-38 ◽  
Author(s):  
John Waicukauski ◽  
Eric Lindbloom ◽  
Barry Rosen ◽  
Vijay Iyengar
Keyword(s):  
Fault Simulation ◽  
Transition Fault

Equivalent Faults under Launch-on-Shift (LOS) Tests with Equal Primary Input Vectors

2021 ◽  
Vol 26 (4) ◽  
pp. 1-15
Author(s):  
Irith Pomeranz
Keyword(s):  
Test Generation ◽  
Fault Simulation ◽  
Single Cycle ◽  
Primary Input ◽  
Test Set ◽  
Efficient Procedure ◽  
Test Compaction ◽  
Transition Faults ◽  
Transition Fault ◽  
Types Of Faults

A recent work showed that it is possible to transform a single-cycle test for stuck-at faults into a launch-on-shift (LOS) test that is guaranteed to detect the same stuck-at faults without any logic or fault simulation. The LOS test also detects transition faults. This was used for obtaining a compact LOS test set that detects both types of faults. In the scenario where LOS tests are used for both stuck-at and transition faults, this article observes that, under certain conditions, the detection of a stuck-at fault guarantees the detection of a corresponding transition fault. This implies that the two faults are equivalent under LOS tests. Equivalence can be used for reducing the set of target faults for test generation and test compaction. The article develops this notion of equivalence under LOS tests with equal primary input vectors and provides an efficient procedure for identifying it. It presents experimental results to demonstrate that such equivalences exist in benchmark circuits, and shows an unexpected effect on a test compaction procedure.

scholarly journals An accurate diagnosis of transition fault clusters based on single fault simulation

2012 ◽  
Vol 9 (19) ◽  
pp. 1528-1533
Author(s):  
Yoseop Lim ◽  
Jaeseok Park ◽  
Sungho Kang
Keyword(s):  
Fault Simulation ◽  
Accurate Diagnosis ◽  
Single Fault ◽  
Transition Fault

A Manual Diagnosis Approach Using Targeted Fault Injection and Fault Simulation to Extend ATPG Diagnostic Resolution in Localizing Faults

2019 ◽  
Author(s):  
Rommel Estores ◽  
Karo Vander Gucht
Keyword(s):  
Fault Injection ◽  
Fault Simulation ◽  
Fault Localization ◽  
Pattern Generation ◽  
Test Coverage ◽  
Actual Case ◽  
Electrical Failure ◽  
Starting Point ◽  
Diagnostic Resolution ◽  
Diagnosis Approach

Abstract This paper discusses a creative manual diagnosis approach, a complementary technique that provides the possibility to extend Automatic Test Pattern Generation (ATPG) beyond its own limits. The authors will discuss this approach in detail using an actual case – a test coverage issue where user-generated ATPG patterns and the resulting ATPG diagnosis isolated the fault to a small part of the digital core. However, traditional fault localization techniques was unable to isolate the fault further. Using the defect candidates from ATPG diagnosis as a starting point, manual diagnosis through fault Injection and fault simulation was performed. Further fault localization was performed using the ‘not detected’ (ND) and/or ‘detected’ (DT) fault classes for each of the available patterns. The result has successfully deduced the defect candidates until the exact faulty net causing the electrical failure was identified. The ability of the FA lab to maximize the use of ATPG in combination with other tools/techniques to investigate failures in detail; is crucial in the fast root cause determination and, in case of a test coverage, aid in having effective test screen method implemented.

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