Symbolic fault simulation for sequential circuits and the multiple observation time test strategy

Proceedings of the 32nd ACM/IEEE conference on Design automation conference - DAC '95 ◽

10.1145/217474.217552 ◽

1995 ◽

Author(s):

R. Krieger ◽

B. Becker ◽

M. Keim

Keyword(s):

Fault Simulation ◽

Observation Time ◽

Sequential Circuits ◽

Test Strategy ◽

Time Test

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Symbolic Fault Simulation for Sequential Circuits and the Multiple Observation Time Test Strategy

32nd Design Automation Conference ◽

10.1109/dac.1995.249970 ◽

1995 ◽

Cited By ~ 1

Author(s):

R. Krieger

Keyword(s):

Fault Simulation ◽

Observation Time ◽

Sequential Circuits ◽

Test Strategy ◽

Time Test

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Increasing fault coverage for synchronous sequential circuits by the multiple observation time test strategy

1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers ◽

10.1109/iccad.1991.185302 ◽

2002 ◽

Cited By ~ 12

Author(s):

I. Pomeranz ◽

S.M. Reddy ◽

L.N. Reddy

Keyword(s):

Fault Coverage ◽

Observation Time ◽

Sequential Circuits ◽

Test Strategy ◽

Synchronous Sequential Circuits ◽

Time Test

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The multiple observation time test strategy

IEEE Transactions on Computers ◽

10.1109/12.142689 ◽

1992 ◽

Vol 41 (5) ◽

pp. 627-637 ◽

Cited By ~ 65

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Observation Time ◽

Test Strategy ◽

Time Test

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Fault simulation for synchronous sequential circuits under the multiple observation time testing approach

Proceedings ETC 93 Third European Test Conference ◽

10.1109/etc.1993.246566 ◽

2002 ◽

Cited By ~ 8

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Fault Simulation ◽

Observation Time ◽

Sequential Circuits ◽

Synchronous Sequential Circuits ◽

Testing Approach

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New methods for parallel pattern fast fault simulation for synchronous sequential circuits

Proceedings ETC 93 Third European Test Conference ◽

10.1109/etc.1993.246617 ◽

2002 ◽

Author(s):

M. Mojtahedi ◽

W. Geisselhardt

Keyword(s):

Fault Simulation ◽

Sequential Circuits ◽

New Methods ◽

Synchronous Sequential Circuits ◽

Parallel Pattern

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Efficient bridging fault simulation of sequential circuits based on multi-valued logics

Proceedings 32nd IEEE International Symposium on Multiple- Valued Logic ◽

10.1109/ismvl.2002.1011092 ◽

2003 ◽

Cited By ~ 6

Author(s):

I. Polian ◽

P. Engelke ◽

B. Becker

Keyword(s):

Fault Simulation ◽

Sequential Circuits ◽

Bridging Fault

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Fault simulation under the multiple observation time approach using backward implications

Proceedings of the 34th annual conference on Design automation conference - DAC '97 ◽

10.1145/266021.266297 ◽

1997 ◽

Author(s):

Irith Pomeranz ◽

Sudhakar M. Reddy

Keyword(s):

Fault Simulation ◽

Observation Time

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Efficient Fault Simulation Algorithms for Analyzing Soft Error Propagation in Sequential Circuits

IPSJ Transactions on System LSI Design Methodology ◽

10.2197/ipsjtsldm.6.127 ◽

2013 ◽

Vol 6 (0) ◽

pp. 127-134 ◽

Cited By ~ 1

Author(s):

Taiga Takata ◽

Masayoshi Yoshimura ◽

Yusuke Matsunaga

Keyword(s):

Error Propagation ◽

Fault Simulation ◽

Sequential Circuits ◽

Soft Error ◽

Simulation Algorithms

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New methods for parallel pattern fast fault simulation for synchronous sequential circuits

Proceedings of 1993 International Conference on Computer Aided Design (ICCAD) ◽

10.1109/iccad.1993.580022 ◽

2002 ◽

Cited By ~ 4

Author(s):

M. Mojtahedi ◽

W. Geisselhardt

Keyword(s):

Fault Simulation ◽

Sequential Circuits ◽

New Methods ◽

Synchronous Sequential Circuits ◽

Parallel Pattern

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Path delay fault simulation algorithms for sequential circuits

Proceedings First Asian Test Symposium (ATS `92) ◽

10.1109/ats.1992.224444 ◽

2003 ◽

Cited By ~ 13

Author(s):

T.J. Chakraborty ◽

V.D. Agrawal ◽

M.L. Bushnell

Keyword(s):

Fault Simulation ◽

Sequential Circuits ◽

Path Delay ◽

Delay Fault ◽

Path Delay Fault ◽

Simulation Algorithms

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