Suppression of Within-Device Variability in Intrinsic Channel Tri-Gate Silicon Nanowire Metal–Oxide–Semiconductor Field-Effect Transistors

2012 ◽  
Vol 51 (2) ◽  
pp. 02BC06 ◽  
Author(s):  
Ke Mao ◽  
Tomoko Mizutani ◽  
Anil Kumar ◽  
Takuya Saraya ◽  
Toshiro Hiramoto
2012 ◽  
Vol 51 ◽  
pp. 04DC06
Author(s):  
Wei Feng ◽  
Ranga Hettiarachchi ◽  
Soshi Sato ◽  
Kuniyuki Kakushima ◽  
Masaaki Niwa ◽  
...  

2008 ◽  
Vol 47 (4) ◽  
pp. 3277-3281 ◽  
Author(s):  
Eu Jin Tan ◽  
Kin Leong Pey ◽  
Navab Singh ◽  
Dong-Zhi Chi ◽  
Guo-Qiang Lo ◽  
...  

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