Growth Mode and Characteristics of the O2-Oxidized Si(100) Surface Oxide Layer Observed by Real Time Photoemission Measurement
1998 ◽
Vol 37
(Part 1, No. 1)
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pp. 261-265
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2016 ◽
Vol 14
(0)
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pp. 48-52
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2012 ◽
Vol 87
(5-6)
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pp. 580-583
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2001 ◽
Vol 46
(12)
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pp. 1767-1772
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2011 ◽
Vol 50
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pp. 115002
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2017 ◽
Vol 42
(5)
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pp. 532-540
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2019 ◽
Vol 17
(2)
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pp. 484-490
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