A RADIOCHEMICAL TECHNIQUE FOR STUDYING RANGE–ENERGY RELATIONSHIPS FOR HEAVY IONS OF KEV ENERGIES IN ALUMINUM

1960 ◽  
Vol 38 (9) ◽  
pp. 1526-1534 ◽  
Author(s):  
J. A. Davies ◽  
J. Friesen ◽  
J. D. McIntyre
Keyword(s):  
Oxide Film ◽  
Heavy Ions ◽  
Aluminum Foil ◽  
Thin Layers ◽  
Ammonium Citrate ◽  
Surface Layers ◽  
Depth Of Penetration ◽  
Energy Relationships ◽  
Anodic Voltage ◽  
Recoil Atoms

A rapid technique has been developed for dissolving successive thin layers of metal from the surface of an aluminum foil: viz. electrochemical oxidation at constant voltage in aqueous ammonium citrate, followed by removal of the oxide film in a phosphoric acid – chromic oxide solution. Due to the highly protective nature of the aluminum oxide film, this two-step process enables very uniform surface layers of metal as thin as 1 μ/cm2 to be removed. The total weight of aluminum dissolved increases with the applied anodic voltage at a rate of 0.30 μg cm−1 volt−1 (approximately 11 Å per volt) over the range 0–150 volts. The technique should be sufficiently sensitive to study the depth of penetration in aluminum of radioactive ions with kinetic energies as low as a few kiloelectron volts.An approximate value for the range of Na24 recoil atoms from the Al27 (n,α) reaction was obtained. A more extensive application to range studies is given in the next paper.

The Use of Ratio-Recording Interferometry for the Measurement of Infrared Emission Spectra: Applications to Oxide Films on Copper Surfaces

1975 ◽  
Vol 29 (6) ◽  
pp. 496-500 ◽  
Author(s):  
D. Kember ◽  
N. Sheppard
Keyword(s):  
Emission Spectra ◽  
Black Body ◽  
Infrared Emission ◽  
Thin Layers ◽  
Oxide Surface ◽  
Surface Layers ◽  
Selective Reflection ◽  
Copper Surfaces ◽  
Emission And Absorption Spectra ◽  
Direct Correspondence

Infrared emission spectra from metal samples with oxide surface layers are shown to be very advantageously studied using the spectrum-ratioing facility of a recording infrared interferometer. The emission from a given sample is ratioed against that from a black-body emitter at the same temperature so as to give emittance as a function of wavenumber directly. This method has very useful application to irregularly shaped metal emitters. In the absence of selective reflection there is a direct correspondence between emission and absorption spectra for thin layers of an emitting substance. However, the presence of selective reflection leads to reduced emission and to considerable differences in the appearance of “absorption” and emission spectra in regions of strong absorption. Emission spectra obtained from copper plates heated, above 150°C, for different periods in air are shown clearly to indicate the presence of cuprous, Cu(I), and cupric, Cu(II), oxides in the surface layer.

scholarly journals A New Experimental Method for Determining the Thickness of Thin Surface Layers of Intensive Plastic Deformation Using Electron Backscatter Diffraction Data

Symmetry ◽  
2020 ◽  
Vol 12 (4) ◽  
pp. 677
Author(s):  
Alexander Smirnov ◽  
Evgeniya Smirnova ◽  
Sergey Alexandrov
Keyword(s):  
Plastic Deformation ◽  
Electron Backscatter Diffraction ◽  
Thin Layers ◽  
New Method ◽  
Metallic Materials ◽  
Surface Layers ◽  
Kernel Average Misorientation ◽  
Electron Backscatter ◽  
Properties Of Materials ◽  
Backscatter Diffraction

It is, in general, essential to investigate correlations between the microstructure and properties of materials. Plastic deformation often localizes within thin layers. As a result, many material properties within such layers are very different from the properties in bulk. The present paper proposes a new method for determining the thickness of a thin surface layer of intensive plastic deformation in metallic materials. For various types of materials, such layers are often generated near frictional interfaces. The method is based on data obtained by Electron Backscatter Diffraction. The results obtained are compared with those obtained by an alternative method based on microhardness measurements. The new method allows for determining the layer thickness of several microns in specimens after grinding. In contrast, the measurement of microhardness does not reveal the presence of this layer. The grain-based and kernel-based types of algorithms are also adopted for determining the thickness of the layer. Data processed by the strain contouring and kernel average misorientation algorithms are given to illustrate this method. It is shown that these algorithms do not clearly detect the boundary between the layer of intensive plastic deformation and the bulk. As a result, these algorithms are unable to determine the thickness of the layer with high accuracy.

Simulation of Structural Transformations in Modified Near-Surface Layers of Crystals

2019 ◽  
Vol 970 ◽  
pp. 276-282
Author(s):  
Yury Borodin ◽  
Anastasia Mantina
Keyword(s):  
Quantum Wells ◽  
Riemannian Space ◽  
Structural Transformations ◽  
Thin Layers ◽  
Surface Layers ◽  
Near Surface ◽  
Internal Geometry ◽  
Structure Ordering

Superlattice formation in thin layers of oxidizing crystals and the effect of near-surface proton saturation on structure ordering, formation and periodical distribution of quantum wells have been discussed. The paper shows, it is necessary to develop non-Euclidean approach to the crystal’s internal geometry and consider, in consecutive order, the question of the four-dimentional Riemannian space into three-dimentional Eucliden space interpretation (RE interpretation).

Study of the Influence of Technological Factors on the Surface Structure of Aluminum 6000 Series Alloys Ingots

2020 ◽  
Vol 299 ◽  
pp. 938-942
Author(s):  
Leonid Moiseevich Gurevich ◽  
Dmitri Pronichev ◽  
Aleksey Serov
Keyword(s):  
Chemical Composition ◽  
Oxide Film ◽  
Surface Structure ◽  
The State ◽  
Ingot Surface ◽  
Surface Layers ◽  
Technological Factors ◽  
Light Color

The structure and chemical composition of the surface layers of aluminum 6000-series alloys after crystallization and homogenization annealing at 580 °C were investigated. It is shown that the state of the surface significantly depends on the presence of impurities in the coolant of the crystallizer, which deteriorate the continuity of the oxide film, which leads to the formation of light color of individual parts of the ingot surface.

Phase analysis of bulk samples using sample-tilting X-ray diffractometry

1992 ◽  
Vol 25 (5) ◽  
pp. 582-588 ◽  
Author(s):  
Q. Cong
Keyword(s):  
Phase Analysis ◽  
Diffraction Method ◽  
Sample Surface ◽  
Geometrical Optics ◽  
Crystal Plane ◽  
X Ray Diffraction ◽  
Surface Layers ◽  
Depth Of Penetration ◽  
X Ray ◽  
Surface Reflection

In the Bragg–Brentano X-ray powder diffractometer, the sample-tilting X-ray diffraction (STD) technique probes a fixed depth of penetration from the sample surface. In this way, phase analysis can be carried out from the surface layers to the depth probed by the CBD (conventional Bragg–Brentano geometry X-ray diffraction) method. In the present paper, after derivation of the diffracted intensity and the observed crystal-plane azimuthal equations, attention is focused on investigations of the geometrical optics of X-ray surface reflection by comparing the STD and CBD methods. Some examples are given to illustrate the applications of the STD technique for solving phase analyses and related problems.

Stress in Aluminium Alloys Measured Using Göbel Mirror as a Primary Beam Optics of X-Ray Diffractometer

2011 ◽  
Vol 681 ◽  
pp. 393-398 ◽  
Author(s):  
Marianna Marciszko ◽  
Andrzej Baczmanski ◽  
Nacer Zazi ◽  
Jean Paul Chopart ◽  
Alain Lodini ◽  
...  
Keyword(s):  
Aluminium Alloys ◽  
Grazing Incidence ◽  
Peak Position ◽  
Thin Layers ◽  
Incidence Geometry ◽  
Primary Beam ◽  
Beam Optics ◽  
Surface Layers ◽  
X Ray ◽  
Grazing Incidence Geometry

Grazing incidence geometry, called MGID-sin2y, was applied to measure surface stresses in very thin layers (depth of a few mm) of Al-Mg alloy samples subjected to different thermal and mechanical treatments. The Göbel mirror was used to parallelize the incident X-ray beam. Perfect collimation of the beam significantly increases accuracy of determined peak position and consequently allows to measure low stresses in surface layers.

Response of Human Osteoblast-Like Cells and Fibroblasts to Titanium Alloy Nitrided under Glow Discharge Conditions

2005 ◽  
Vol 475-479 ◽  
pp. 2415-2418 ◽  
Author(s):  
E. Czarnowska ◽  
A. Sowinska ◽  
B. Cukrowska ◽  
Jerzy Robert Sobiecki ◽  
Tadeusz Wierzchoń
Keyword(s):  
Titanium Alloy ◽  
Glow Discharge ◽  
Oxide Film ◽  
Surface Composition ◽  
In Vitro Study ◽  
Specific Cell ◽  
Surface Layers ◽  
Surface Microtopography ◽  
Nitrided Surface

Cell adhesion to biomaterials and cell proliferation are affected, among others, by the chemical composition and surface microtopography of the biomaterial. These are, in turn, influenced by sterilisation processes. The aim of this study was to evaluate the sensitivity of osteoblasts and fibroblasts to TiN surfaces deprived of an oxide film or with an enhanced oxide film due to sterilisation in plasma or in an autoclave, respectively. Type TiN+T2N+aTi(N) nitrided surface layers were produced under glow discharge conditions and sterilized in plasma Sterrad 100 and in a steam autoclave. The results provide evidence that nitrided surface layers improved wearand corrosion resistance of the titanium alloy and that these features were not influenced by sterilisation procedures that resulted in various oxide films. In vitro study of human fibroblast and osteoblast-like cells cultured on TiN surfaces modified by sterilisation processes showed that cells respond to the presence of an enhanced oxide film by aggregating, exhibiting lower viability and increased apoptosis, while to a surface deprived of oxides, by regular spreading and high viability. It can be concluded that differences in surface composition and topography of the nitrided surface layers due to various types of sterilisation elicit specific cell responses, and plasma sterilisation seems to be optimal for bone implants with this surface layer.

scholarly journals Direct brazing of Al2O3 without reaction layer by self-removing oxide film Aluminum foil solder

2020 ◽  
Vol 128 (6) ◽  
pp. 305-309
Author(s):  
Bingyang MA ◽  
Zixian TAN ◽  
Xiaoben QI ◽  
Rongbin LI ◽  
Geyang LI ◽  
...  
Keyword(s):  
Oxide Film ◽  
Reaction Layer ◽  
Aluminum Foil
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