Study of the elastic properties of sprayed SnO2 and SnS2 layers

2000 ◽  
Vol 77 (9) ◽  
pp. 705-715
Author(s):  
M Mnari ◽  
B Cros ◽  
M Amlouk ◽  
S Belgacem ◽  
D Barjon
Keyword(s):  
High Frequency ◽  
Chemical Structure ◽  
Spray Pyrolysis Technique ◽  
Acoustic Microscopy ◽  
Acoustic Parameters ◽  
Force Microscopy ◽  
Photovoltaic Application ◽  
Atomic Force ◽  
Acoustic Signature ◽  
Acoustic Images

SnO2 and SnS2 thin films have been prepared by the spray pyrolysis technique for photovoltaic application purposes and characterized by high-frequency acoustic microscopy (570 MHz).The surface acoustic images reveal contrasts explained by differences in topography according to atomic force microscopy studies. The acoustic signature V(z) of the systemslayer/substrate were modelled and refined to fit with the experimental V(z). The acoustic parameters of the layers were calculated using the results of the final simulation. The values of Young's modulus deduced from the acoustic parameters, 401 and 56 GPa for SnO2 and SnS2, respectively, are discussed in relation with the chemical structure and bonding involved. PACS Nos.: 43.35Ns and 62.65

Optical and Structural Properties of Fluorine Doped SnO2 on Si (100) for Photovoltaic Application

2018 ◽  
Vol 13 (10) ◽  
pp. 1522-1532 ◽  
Author(s):  
S. Nivetha ◽  
K. Kaviyarasu ◽  
A. Ayeshamariam ◽  
N. Punithavelan ◽  
R. Perumalsamy ◽  
...  
Keyword(s):  
Spray Pyrolysis Technique ◽  
Energy Difference ◽  
Vital Role ◽  
X Ray Diffraction ◽  
Energy Storage Devices ◽  
Sem Images ◽  
Storage Devices ◽  
Force Microscopy ◽  
Photovoltaic Application ◽  
Atomic Force

Photovoltaic material plays a vital role in the production of energy storage devices, more specifically in solar cell fabrications. In this work, ITO:F-doped materials were coated over the silicon substrate through spray pyrolysis technique. X-ray diffraction studies were conducted for porous silicon (PSi) coated with ITO:F structures formed at different current densities. This pore formation is evident from the broad peak at 69.9°, revealing an amorphous-like nature but at the same location where the single crystalline peak also is observed. These pores are explicitly shown in the SEM images in which very fine surface fragments are observed. At 20 mA/cm2, well-defined porous patterns that were uniformly distributed over the surface were observed. The microstructures observed via atomic force microscopy for these PSi coated with ITO:F structures are randomly aligned and almost evenly distributed over the entire surface of these nanorods, which are approximately 40 nm. Radiative recombination of electrons from a level in the conduction band or its subband to a level at an energy difference of greater than 1.7 eV in the valance band or its subband will emit visible light.

scholarly journals Self-driving capacitive cantilevers for high-frequency atomic force microscopy

2012 ◽  
Vol 100 (5) ◽  
pp. 053110 ◽  
Author(s):  
Keith A. Brown ◽  
Benjamin H. Yang ◽  
R. M. Westervelt
Keyword(s):  
Atomic Force Microscopy ◽  
High Frequency ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Chemical structure imaging of a single molecule by atomic force microscopy at room temperature

2015 ◽  
Vol 6 (1) ◽  
Author(s):  
Kota Iwata ◽  
Shiro Yamazaki ◽  
Pingo Mutombo ◽  
Prokop Hapala ◽  
Martin Ondráček ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Single Molecule ◽  
Chemical Structure ◽  
Room Temperature ◽  
Force Microscopy ◽  
Atomic Force

Synthesis and Atomic Force Microscopy Contact Current Images of Aluminum Doped ZnO Thin Films

2010 ◽  
Vol 644 ◽  
pp. 109-112
Author(s):  
N. Muñoz Aguirre ◽  
J. Eduardo Rivera-López ◽  
L. Martínez Pérez ◽  
Pedro A. Tamayo Meza
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Spray Pyrolysis Technique ◽  
Water Mist ◽  
Zno Thin Films ◽  
Electrical Characteristics ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Atomic Force ◽  
Doped Zno

Aluminum doped ZnO thin films were synthesized by the water-mist assisted spray pyrolysis technique. The structural characterization by means of X-Ray diffraction measurements is reported. By means of Atomic Force Microscopy, the superficial electrical characteristics of the thin films are studied. Specifically, contact current images are shown and discussed. It is important to emphasize that in spite of no voltage is applied to the Atomic Force Microscopy contact conductive tip, current images are getting.

scholarly journals Nanoscale Molecular Characterisation of Hair Cuticles using Integrated AFM-IR

2020 ◽  
Author(s):  
A. P. Fellows ◽  
M. T. L. Casford ◽  
P. B. Davies
Keyword(s):  
Chemical Structure ◽  
High Surface ◽  
Great Majority ◽  
Diffraction Limit ◽  
Chemical Investigation ◽  
Molecular Characterisation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Surface Spectroscopy ◽  
Significant Chemical

AbstractThe nanometre-scale topography and chemical structure of hair cuticles has been investigated by vibrational spectroscopy and imaging in two spectral regions. The combination of Atomic Force Microscopy with a tuneable infrared laser (AFM-IR) circumvents the diffraction limit that has impaired traditional infrared spectroscopy, facilitating surface spectroscopy at ultra-spatial resolution. The variation in protein and lipid content of the cuticle cell surface approaching its edge, as well as the exposed layered structure of the cell at the edge itself, was investigated. Furthermore, the contribution of cystine-related products to the cuticle layers was determined. The variation of protein, lipid and cystine composition in the observed layers, as well as the measured dimensions of each, correspond closely to that of the epicuticle, A-layer, exocuticle and endocuticle layers of the cuticle cell sub-structure.Statement of SignificanceUsing AFM-IR to analyse the nanoscale cuticle features is both significant and novel in the field. Thus far, the great majority of work on the chemical investigation of the structure of hair has been limited to bulk measurements, or subject to the diffraction limit associated with traditional IR spectroscopies and microscopies. AFM-IR circumvents this diffraction limit and allows nanometre-scale, localised chemical investigation with high surface selectivity. While non-chemical investigations, e.g. those using Transmission Election Microscopy, have previously shown cuticles to have a layered substructure, AFM-IR sheds light on significant chemical variations of protein and lipid compositions within such layers, enabling their quantification.

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