Hydrogen-assisted reactive evaporation of quasi-stoichiometric polycrystalline InSb films

1992 ◽  
Vol 70 (5) ◽  
pp. 319-321
Author(s):  
G. Leclerc ◽  
J. Beerens ◽  
C. Aktik ◽  
L. Paquin ◽  
M. Isai
Keyword(s):  
New Technique ◽  
X Ray Diffraction ◽  
X Ray ◽  
Reactive Evaporation ◽  
Diffraction Patterns ◽  
A New Technique

We report here a new technique for evaporating polycrystalline InSb films, using hydrogen beams as carriers for each elemental source. The films obtained show X-ray diffraction patterns before annealing that are totally exempt from impurity peaks, unlike those other workers have previously reported for evaporated InSb.

Study of diffraction data sets using factor analysis: a new technique for comparing mineralogical and geochemical data and rapid diagnostics of the mineral composition of large collections of rock samples

2019 ◽  
Vol 34 (S1) ◽  
pp. S59-S70 ◽  
Author(s):  
Ekaterina Fomina ◽  
Evgeniy Kozlov ◽  
Svetlana Ivashevskaja
Keyword(s):  
Geochemical Data ◽  
Chemical Compositions ◽  
Data Sets ◽  
Rapid Diagnostics ◽  
X Ray Diffraction ◽  
X Ray ◽  
Short Period ◽  
Diffraction Patterns ◽  
A New Technique

This paper presents an example of comparing geochemical and mineralogical data by means of the statistical analysis of the X-ray diffraction patterns and the chemical compositions of bulk samples. The proposed methodology was tested on samples of metasomatic rocks from two geologically different objects. Its application allows us to mathematically identify all the main, secondary and some accessory minerals, to qualitatively estimate the contents of these minerals, as well as to assess their effect on the distribution of all petrogenic and investigated trace elements in a short period of time at the earliest stages of the research. We found that the interpretation of the results is significantly influenced by the number of samples studied and the quality of diffractograms.

New Technique for Quantitative SiO2 Determinations of Silicate Materials by X-Ray Diffraction Analysis of Glass

1963 ◽  
Vol 7 ◽  
pp. 209-228 ◽  
Author(s):  
Douglas B. Nash
Keyword(s):  
Diffraction Analysis ◽  
Silicate Glasses ◽  
New Technique ◽  
Inverse Relation ◽  
Diffraction Maximum ◽  
X Ray Diffraction ◽  
X Ray ◽  
The Mean ◽  
A New Technique ◽  
Silicate Materials

AbstractResults of an experimental X-ray study on 96 synthetic glasses show that the 2θ positions of glass diffraction maxima have an inverse relation to SiO2 concentration in silicate glasses. This relationship is the basis of a new technique for semiquantitative determinations of SiOa in silicate materials by X-ray diffraction methods. Samples to be examined are fused and the resulting glass scanned from 12 to 40° 2θ using CiiKa radiation. The mean 2θ position of the diffraction maximum is a measure of the SiOs content of the glass. Calibration curves for both weight and molecular percent SiO2 vs. 2θ are presented in this report. The technique requires only small, unweighed amounts of sample for analysis ; it is simple, rapid, and utilizes standard diffraction equipment without modification. Its accuracy, at present, allows SiOa determinations to within ±1 to 4% of the actual concentration.

A New Technique of X-Ray Diffraction Microscopy of Scanning Type

1967 ◽  
Vol 6 (12) ◽  
pp. 1393-1396
Author(s):  
Seigô Kishino ◽  
Yoshimitsu Sugita ◽  
Kazutake Kohra
Keyword(s):  
New Technique ◽  
X Ray Diffraction ◽  
X Ray ◽  
A New Technique ◽  
Diffraction Microscopy

scholarly journals Combined QEXAFS-XRD, a new technique combiningin situfast scanning X-ray absorption spectroscopy and X-ray diffraction

1993 ◽  
Vol 49 (s1) ◽  
pp. c10-c10
Author(s):  
G. N. Greaves ◽  
A. J. Dent ◽  
B. R. Dobson ◽  
S. M. Clark ◽  
C. A. Ramsdale ◽  
...  
Keyword(s):  
Absorption Spectroscopy ◽  
New Technique ◽  
X Ray Diffraction ◽  
X Ray ◽  
A New Technique ◽  
X Ray Absorption

A new technique for time‐resolved x‐ray diffraction measurements in the single‐bunch operation applied to laser annealing

1995 ◽  
Vol 66 (2) ◽  
pp. 1419-1421 ◽  
Author(s):  
S. Kojima ◽  
Y. Kudo ◽  
S. Kawado ◽  
T. Ishikawa ◽  
T. Matsushita
Keyword(s):  
Laser Annealing ◽  
New Technique ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
A New Technique

Evaluation of Freezing Methods by Low Temperature X-Ray Diffraction

1977 ◽  
Vol 35 ◽  
pp. 330-333
Author(s):  
T. Gulik-Krzywicki ◽  
M.J. Costello
Keyword(s):  
Biological Materials ◽  
Molecular Organization ◽  
X Ray Diffraction ◽  
Glass Capillary ◽  
X Ray ◽  
Rate Dependent ◽  
Before And After ◽  
Freeze Etching ◽  
Diffraction Patterns ◽  
Set Up

Freeze-etching electron microscopy is currently one of the best methods for studying molecular organization of biological materials. Its application, however, is still limited by our imprecise knowledge about the perturbations of the original organization which may occur during quenching and fracturing of the samples and during the replication of fractured surfaces. Although it is well known that the preservation of the molecular organization of biological materials is critically dependent on the rate of freezing of the samples, little information is presently available concerning the nature and the extent of freezing-rate dependent perturbations of the original organizations. In order to obtain this information, we have developed a method based on the comparison of x-ray diffraction patterns of samples before and after freezing, prior to fracturing and replication.Our experimental set-up is shown in Fig. 1. The sample to be quenched is placed on its holder which is then mounted on a small metal holder (O) fixed on a glass capillary (p), whose position is controlled by a micromanipulator.

Examination of Rabbit Fc Crystals

1968 ◽  
Vol 26 ◽  
pp. 140-141
Author(s):  
J. P. Robinson ◽  
P. G. Lenhert
Keyword(s):  
Molecular Weight ◽  
Flat Plate ◽  
Phosphate Buffer ◽  
Asymmetric Unit ◽  
X Ray Diffraction ◽  
X Ray ◽  
Neutral Ph ◽  
Small Crystals ◽  
Carbon Coated ◽  
Diffraction Patterns

Crystallographic studies of rabbit Fc using X-ray diffraction patterns were recently reported. The unit cell constants were reported to be a = 69. 2 A°, b = 73. 1 A°, c = 60. 6 A°, B = 104° 30', space group P21, monoclinic, volume of asymmetric unit V = 148, 000 A°3. The molecular weight of the fragment was determined to be 55, 000 ± 2000 which is in agreement with earlier determinations by other methods.Fc crystals were formed in water or dilute phosphate buffer at neutral pH. The resulting crystal was a flat plate as previously described. Preparations of small crystals were negatively stained by mixing the suspension with equal volumes of 2% silicotungstate at neutral pH. A drop of the mixture was placed on a carbon coated grid and allowed to stand for a few minutes. The excess liquid was removed and the grid was immediately put in the microscope.

A new technique for measuring the polarization from celestial X-ray sources

1993 ◽  
Author(s):  
Robert Austin ◽  
Takahisa Minamitani ◽  
Brian Ramsey
Keyword(s):  
New Technique ◽  
X Ray ◽  
A New Technique
Sign in / Sign up

Export Citation Format

Share Document