Infrared emission from strained-Si1−xGex quantum wells
Photoluminescence was observed for molecular beam epitaxy (MBE) grown Si1−xGex layers with 0.06 < x < 0.60. The spectrum was generally dominated by a ~80 meV wide peak centered ~120 meV below the strained Si1−xGex-alloy band gap, a peak which shifted consistently with Ge concentration. Electroluminescence with a peak energy of 860 meV was observed from a SiGe pin heterostructure grown by MBE and fabricated into mesa diodes. The electroluminescence persisted to temperatures up to 80 K with the diode forward biased at current densities as large as 50 A cm−2. Comparisons are made with the photoluminescence spectra of the same material and an estimate of quantum efficiency is given. A luminescence mechanism involving bound-exciton annihilation without phonon assistance is discussed.