Elastic scattering phenomena in mass analyzers with tandem fields
Keyword(s):
Ion Beam
◽
The elastic scattering in the tandem field mass analyzing systems is considered. The analysis includes deflecting electrostatic and magnetic converging, dispersing, diverging fields, and also the fields of quadrupoles. The influence of slits located on the ion beam path is indicated. An example illustrates the effect of slits on the elastically scattered current distribution in a double focusing mass spectrometer. Another example gives an idea about the influence of the diverging field on the peak tails in mass spectra.
2001 ◽
Vol 370
(5)
◽
pp. 663-670
◽
Keyword(s):
1967 ◽
Vol 22
(4)
◽
pp. 454-459
◽
Keyword(s):
2003 ◽
Vol 41
(2)
◽
pp. 259-272
◽
Keyword(s):
2011 ◽
Vol 22
(8)
◽
pp. 1388-1394
◽
2016 ◽
Vol 87
(8)
◽
pp. 083112
◽
Keyword(s):
1997 ◽
Vol 12
(9)
◽
pp. 933-937
◽
2005 ◽
Vol 242
(2-3)
◽
pp. 297-302
◽
1986 ◽
Vol 74
(1)
◽
pp. 129-131
◽