The Influence of the Electrode Diameter on the Diffraction Effects in the Ultrasonic Field Generated by an Oscillating Piezoelectric Disk

2005 ◽  
Vol 51 (4) ◽  
pp. 392 ◽  
Author(s):  
V. V. Galanin
Keyword(s):  
Ultrasonic Field ◽  
Electrode Diameter ◽  
Piezoelectric Disk ◽  
Diffraction Effects

Discovery and Measurement of Double Stars by Lunar Occultations

1965 ◽  
Vol 5 ◽  
pp. 28-37
Author(s):  
R. Edward Nather ◽  
David S. Evans
Keyword(s):  
The Moon ◽  
Double Stars ◽  
Stellar Diameters ◽  
Diffraction Effects

When a star is occulted by the dark limb of the Moon its apparent intensity drops to zero very quickly. MacMahon (1909) proposed that the time of disappearance would measure the diameter of the star, but Eddington (1909) demonstrated that diffraction effects at the lunar limb would lengthen the apparent time of disappearance to about 20 msec, and suggested that these effects would greatly limit the usefulness of the technique. MacMahon’s paper indicates that he was aware that stellar duplicity could be detected from occultation observations, but he did not amplify the point and Eddington did not comment on it. While it has been demonstrated theoretically by Williams (1939) and experimentally by Whitford (1939) and others that stellar diameters of a few arcmsec can be measured by this technique, its use for the discovery and measurement of double stars has been only incidental to other programs (O’Keefe and Anderson, 1952; Evanset al., 1954). Properly exploited, the method can contribute materially to the study of double stars.

Transmission Electron Diffraction Analysis by Computer

1970 ◽  
Vol 28 ◽  
pp. 40-41
Author(s):  
R.A. Ploc ◽  
G.H. Keech
Keyword(s):  
Electron Diffraction ◽  
Input Data ◽  
Reciprocal Lattice ◽  
Computer Programme ◽  
Transmission Electron Diffraction ◽  
Usual Procedure ◽  
Transmission Electron ◽  
Complex Shapes ◽  
Computer Input ◽  
Diffraction Effects

An unambiguous analysis of transmission electron diffraction effects requires two samplings of the reciprocal lattice (RL). However, extracting definitive information from the patterns is difficult even for a general orthorhombic case. The usual procedure has been to deduce the approximate variables controlling the formation of the patterns from qualitative observations. Our present purpose is to illustrate two applications of a computer programme written for the analysis of transmission, selected area diffraction (SAD) patterns; the studies of RL spot shapes and epitaxy.When a specimen contains fine structure the RL spots become complex shapes with extensions in one or more directions. If the number and directions of these extensions can be estimated from an SAD pattern the exact spot shape can be determined by a series of refinements of the computer input data.

Characteristic Geometry and Diffraction Contrast of Dispersed ThO2 Crystals

1969 ◽  
Vol 27 ◽  
pp. 168-169
Author(s):  
R. J. Horylev ◽  
L. E. Murr
Keyword(s):  
Dark Field ◽  
Particle Orientation ◽  
Contrast Effects ◽  
Strain Fields ◽  
Diffraction Contrast ◽  
Dispersed Particles ◽  
Field Electron Microscopy ◽  
Dark Field Electron ◽  
Particle Images ◽  
Diffraction Effects

Smith has shown by dark-field electron microscopy of extracted ThO2 particles from TD-nickel (2% ThO2) that they possess single crystal characteristics. It is generally assumed that these particle dispersions are incoherent. However, some diffraction effects associated with the particle images appeared to be similar to coherency strain fields. The present work will demonstrate conclusively that ThO2 dispersed particles in TD-nickel (2% ThO2) and TD-NiCr (2% ThO2, 20% Cr, Ni) are single crystals. Moreover, the diffraction contrast effects are extinction fringes. That is, these effects arise because of the particle orientation with respect to the electron beam and the extinction conditions for various operating reflections The particles are in fact incoherent.

Diffraction effects from inclined grain boundaries in polycrystalline thin foils

1978 ◽  
Vol 36 (1) ◽  
pp. 420-421
Author(s):  
C.B. Carter ◽  
A.M. Donald ◽  
S.L. Sass
Keyword(s):  
Thin Film ◽  
Grain Boundaries ◽  
Boundary Plane ◽  
Foil Surface ◽  
Thin Foils ◽  
The Matrix ◽  
Firm Basis ◽  
Diffraction Patterns ◽  
Wave Matching ◽  
Diffraction Effects

Using thin-film gold bicrystals with the boundary plane parallel to the foil surface, it has been shown(l,2) that networks of grain boundary dislocations can act as diffraction gratings and give rise to subsidiary reflections close to the matrix reflections in electron diffraction patterns. Recently several groups of workers(3-5) have shown that inclined boundaries in polycrystalline specimens also produce extra reflections which may be due to the periodic nature of the boundaries. In general grain boundaries in polycrystalline specimens will be steeply inclined to the foil surface and additional reflections due to wave matching at the boundary(6) will also be present. The diffraction technique has the potential for providing detailed information on the structure of inclined boundaries (see, for example (5)), especially for the case where the image contains no useful information. In order to provide a firm basis for this technique, the geometry of the diffraction effects expected from inclined boundaries and the influence of these effects on the appearance of images will be examined.

Off-axis electron holography applied to the study of interfaces

1992 ◽  
Vol 50 (1) ◽  
pp. 244-245
Author(s):  
J.K. Weiss ◽  
M. Gajdardziska-Josifovska ◽  
M. R. McCartney ◽  
David J. Smith
Keyword(s):  
Electric Fields ◽  
Resolution Enhancement ◽  
Interfacial Structure ◽  
Atomic Scale ◽  
Bulk Property ◽  
Electron Holography ◽  
Specimen Thickness ◽  
Composition And Structure ◽  
Chemical Segregation ◽  
Diffraction Effects

Interfacial structure is a controlling parameter in the behavior of many materials. Electron microscopy methods are widely used for characterizing such features as interface abruptness and chemical segregation at interfaces. The problem for high resolution microscopy is to establish optimum imaging conditions for extracting this information. We have found that off-axis electron holography can provide useful information for the study of interfaces that is not easily obtained by other techniques.Electron holography permits the recovery of both the amplitude and the phase of the image wave. Recent studies have applied the information obtained from electron holograms to characterizing magnetic and electric fields in materials and also to atomic-scale resolution enhancement. The phase of an electron wave passing through a specimen is shifted by an amount which is proportional to the product of the specimen thickness and the projected electrostatic potential (ignoring magnetic fields and diffraction effects). If atomic-scale variations are ignored, the potential in the specimen is described by the mean inner potential, a bulk property sensitive to both composition and structure. For the study of interfaces, the specimen thickness is assumed to be approximately constant across the interface, so that the phase of the image wave will give a picture of mean inner potential across the interface.

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