Formation of desired concentration profiles of embedded atoms and radiation-induced defects by using monochromatic fast ion beams
2008 ◽
Vol 374
(1-2)
◽
pp. 293-297
◽
1990 ◽
Vol 48
(4)
◽
pp. 92-93
1986 ◽
Vol 47
(C8)
◽
pp. C8-1045-C8-1048
1994 ◽
Vol 33
(Part 2, No. 2B)
◽
pp. L233-L234
◽
2008 ◽
Vol 266
(12-13)
◽
pp. 2834-2841
◽
1994 ◽
Vol 33
(Part 2, No. 1B)
◽
pp. L139-L142
◽