Structure of the Ultrathin Aluminum Oxide Film on NiAl(110)

Science ◽  
2005 ◽  
Vol 308 (5727) ◽  
pp. 1440-1442 ◽  
Author(s):  
G. Kresse
Keyword(s):  
Oxide Film ◽  
Aluminum Oxide ◽  
Aluminum Oxide Film

Fabrication of Anodic Aluminum Oxide Film on Large-Area Glass Substrate

2007 ◽  
Vol 10 (12) ◽  
pp. C69 ◽  
Author(s):  
Ching-Jung Yang ◽  
Shih-Wei Liang ◽  
Pu-Wei Wu ◽  
Chih Chen ◽  
Jia-Min Shieh
Keyword(s):  
Oxide Film ◽  
Aluminum Oxide ◽  
Glass Substrate ◽  
Anodic Aluminum Oxide ◽  
Large Area ◽  
Anodic Aluminum Oxide Film ◽  
Aluminum Oxide Film ◽  
Anodic Aluminum

Strength and Adhesion of Thin Aluminum Oxide Film Deposited on Iron Surface

1993 ◽  
Vol 115 (4) ◽  
pp. 615-619 ◽  
Author(s):  
M. Nakanishi ◽  
H. Okuya ◽  
K. Nakajima
Keyword(s):  
Oxide Film ◽  
Aluminum Oxide ◽  
Substrate Surface ◽  
Iron Surface ◽  
Indentation Hardness ◽  
Aluminum Oxide Film ◽  
Thin Aluminum ◽  
Atomic Mixing ◽  
Scratch Tests ◽  
Sputter Etching

The strength of deposited film and the adhesion between the film and the substrate were investigated with deposited aluminum oxide film on iron surface by scratching the surface with a diamond cone. Two types of samples were examined, one with oxide film deposited after cleaning the substrate surface by sputter etching, the other with the film deposited without any sputter etching. It was found that a law similar to Meyers’ for indentation hardness holds between the load and scratch width on the sample examined. These results suggest that by analyzing the scratch data the adhesion strength of the film to the substrate can be estimated together with the hardness of the film itself. Analyses by EPMA (electron probe X-ray microanalyzer) and AES (Auger electron spectroscopy) were conducted to correlate the results obtained by the scratch tests and friction experiments, and it was confirmed that (i) adhesion is improved by sputter etching prior to the deposition of the film; (ii) adhesion decreases considerably due to the progress of oxidation in the vicinity of the interface, which depends markedly on the oxygen concentration in the oxide film; and (iii) there is an optimum thickness of the three-component layer (Fe, Al, and O) formed by atomic mixing at the interface for maximizing the adhesion.

Micro-capacitor with vertically grown silver nanowires and bismuth ferric oxide composite structures on silicon substrates

2016 ◽  
Vol 51 (7) ◽  
pp. 965-969 ◽  
Author(s):  
Daniel Choi ◽  
Boo Hyun An ◽  
Mariam Mansouri ◽  
Dima Ali ◽  
Malathe Khalil ◽  
...  
Keyword(s):  
Thin Film ◽  
Oxide Film ◽  
Aluminum Oxide ◽  
Ferric Oxide ◽  
Silver Nanowires ◽  
Silicon Substrates ◽  
Anodized Aluminum ◽  
Anodized Aluminum Oxide ◽  
Oxide Composite ◽  
Aluminum Oxide Film

We have designed and demonstrated a complementary metal-oxide-semiconductor compatible process for fabricating high capacitance micro-capacitors based on vertically grown silver nanowires on silicon substrates. Array of silver nanowires with high-aspect ratio were electrochemically grown in the pores of anodized aluminum oxide film, which was pre-formed through anodization of aluminum thin film deposited on titanium/silicon oxide/silicon substrates. High dielectric bismuth ferric oxide layer was electrodeposited to fill the gap between silver nanowires after anodized aluminum oxide film was removed. It was found that the micro-capacitor based on the silver nanowires/bismuth ferric oxide composite film possessed higher capacitance by approximately one order of magnitude from the COMSOL simulation results from the flat Ag thin-film capacitor and the silver nanowire capacitor.

Facile fabrication and optical characterization of nanoflake aluminum oxide film with high broadband and omnidirectional transmittance enhancement

2020 ◽  
pp. 110567
Author(s):  
T. Lertvanithphol ◽  
P. Limnonthakul ◽  
C. Hom-on ◽  
P. Jaroenapibal ◽  
C. Chananonnawathorn ◽  
...  
Keyword(s):  
Oxide Film ◽  
Aluminum Oxide ◽  
Optical Characterization ◽  
Aluminum Oxide Film ◽  
Facile Fabrication

scholarly journals Measurement of aluminum oxide film by Fabry–Pérot interferometry and scanning electron microscopy

2017 ◽  
Vol 21 (8) ◽  
pp. 938-942
Author(s):  
Farzia Karim ◽  
Tanujjal Bora ◽  
Mayur Chaudhari ◽  
Khaled Habib ◽  
Waleed Mohammed ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Oxide Film ◽  
Aluminum Oxide ◽  
Aluminum Oxide Film ◽  
Fabry Perot ◽  
Scanning Electron

Improvement of Electrode/ Organic Layer Interfaces by the Insertion of Monolayer-like Aluminum Oxide Film

1998 ◽  
Vol 37 (Part 2, No. 7B) ◽  
pp. L872-L875 ◽  
Author(s):  
Yoshitaka Kurosaka ◽  
Norio Tada ◽  
Yutaka Ohmori ◽  
Katsumi Yoshino
Keyword(s):  
Oxide Film ◽  
Aluminum Oxide ◽  
Organic Layer ◽  
Aluminum Oxide Film
Sign in / Sign up

Export Citation Format

Share Document