scholarly journals Negative resistance state in superconducting NbSe2 induced by surface acoustic waves

2020 ◽  
Vol 6 (34) ◽  
pp. eaba1377
Author(s):  
Masahiko Yokoi ◽  
Satoshi Fujiwara ◽  
Tomoya Kawamura ◽  
Tomonori Arakawa ◽  
Kazushi Aoyama ◽  
...  

We report a negative resistance, namely, a voltage drop along the opposite direction of a current flow, in the superconducting gap of NbSe2 thin films under the irradiation of surface acoustic waves (SAWs). The amplitude of the negative resistance becomes larger by increasing the SAW power and decreasing temperature. As one possible scenario, we propose that soliton-antisoliton pairs in the charge density wave of NbSe2 modulated by the SAW serve as a time-dependent capacitance in the superconducting state, leading to the dc negative resistance. The present experimental result would provide a previously unexplored way to examine nonequilibrium manipulation of the superconductivity.

Author(s):  
Kemining W. Yeh ◽  
Richard S. Muller ◽  
Wei-Kuo Wu ◽  
Jack Washburn

Considerable and continuing interest has been shown in the thin film transducer fabrication for surface acoustic waves (SAW) in the past few years. Due to the high degree of miniaturization, compatibility with silicon integrated circuit technology, simplicity and ease of design, this new technology has played an important role in the design of new devices for communications and signal processing. Among the commonly used piezoelectric thin films, ZnO generally yields superior electromechanical properties and is expected to play a leading role in the development of SAW devices.


1998 ◽  
Vol 77 (5) ◽  
pp. 1195-1202
Author(s):  
Andreas Knabchen Yehoshua, B. Levinson, Ora

Author(s):  
Way-Jam Chen ◽  
Lily Shiau ◽  
Ming-Ching Huang ◽  
Chia-Hsing Chao

Abstract In this study we have investigated the magnetic field associated with a current flowing in a circuit using Magnetic Force Microscopy (MFM). The technique is able to identify the magnetic field associated with a current flow and has potential for failure analysis.


2014 ◽  
Author(s):  
Jean-Charles Beugnot ◽  
Sylvie Lebrun ◽  
Gilles Pauliat ◽  
Vincent Laude ◽  
Thibaut Sylvestre

2000 ◽  
Vol 284-288 ◽  
pp. 1732-1733
Author(s):  
Irina L Drichko ◽  
Andrey M Diakonov ◽  
Valery V Preobrazenskii ◽  
Ivan Yu Smirnov ◽  
Alexandr I Toropov

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