Measuring contact area in synthetic vocal fold replicas using electrical resistance

2016 ◽  
Vol 139 (4) ◽  
pp. 2221-2221
Author(s):  
Kyle L. Syndergaard ◽  
Stephen Warner ◽  
Shelby Dushku ◽  
Scott L. Thomson
1988 ◽  
Vol 31 (3) ◽  
pp. 338-351 ◽  
Author(s):  
Martin Rothenberg ◽  
James J. Mahshie

A number of commercial devices for measuring the transverse electrical conductance of the thyroid cartilage produce waveforms that can be useful for monitoring movements within the larynx during voice production, especially movements that are closely related to the time-variation of the contact between the vocal folds as they vibrate. This paper compares the various approaches that can be used to apply such a device, usually referred to as an electroglottograph, to the problem of monitoring the time-variation of vocal fold abduction and adduction during voiced speech. One method, in which a measure of relative vocal fold abduction is derived from the duty cycle of the linear-phase high pass filtered electroglottograph waveform, is developed in detail.


1986 ◽  
Vol 80 (5) ◽  
pp. 1309-1320 ◽  
Author(s):  
D. G. Childers ◽  
D. M. Hicks ◽  
G. P. Moore ◽  
Y. A. Alsaka

2016 ◽  
Vol 30 (2) ◽  
pp. 161-171 ◽  
Author(s):  
Vít Hampala ◽  
Maxime Garcia ◽  
Jan G. Švec ◽  
Ronald C. Scherer ◽  
Christian T. Herbst
Keyword(s):  

1999 ◽  
Vol 563 ◽  
Author(s):  
Z. Suo ◽  
Q. Ma ◽  
W. K. Meyer

AbstractThis paper considers an aluminum line in a multilevel interconnect structure. Upon cooling from the processing temperature, differential thermal contraction causes a triaxial tensile stress state in the aluminum line; voids may initiate and grow to relax the stress. When a direct voltage is applied, the electric current causes aluminum atoms to diffuse. The interconnect will evolve to a state with a high pressure at the anode, and a large void at the cathode. The pressure may crack the surrounding insulator or debond an interface, extruding aluminum. The void may uncover the via contact area, substantially increasing electrical resistance. Provided neither failure mode occurs, aluminum electromigration will stop and the interconnect will function forever. This paper examines the conditions under which the interconnect is immortal.


2013 ◽  
Vol 705 ◽  
pp. 365-370 ◽  
Author(s):  
Marilena Glovnea ◽  
Cornel Suciu

An important parameter in MEMS design is the electrical contact resistance. This depends on material conductibility, on the geometry of the contacting surfaces, on the applied load and on the current passing through the contact. This work aims to experimentally investigate the dependence between: electrical contact resistance and contact load force, contact resistance and contact area and contact perimeter for constant current through a microcontact.


1987 ◽  
Vol 81 (S1) ◽  
pp. S37-S37 ◽  
Author(s):  
Ingo R. Titze ◽  
David Druker ◽  
Paul Durham
Keyword(s):  

1984 ◽  
Vol 27 (2) ◽  
pp. 178-182 ◽  
Author(s):  
H. R. Gilbert ◽  
Charles R. Potter ◽  
Ronald Hoodin

The present investigation sought to provide additional information concerning the laryngograph as a means to study vocal fold contact area. Subglottal pressures were sensed simultaneously with the laryngographic signal while the speaker produced a variety of speech tasks. The onset and cessation of the subglottal pressure waveform was studied relative to the laryngographic and speech waveforms. Differences were noted for voiced-voiceless contrasts for bilabial stop consonant production and vocal effort changes during the three vowels studied. Also a high-resistance polymer strip was placed between the vocal folds and gradually removed while simultaneous laryngographic recordings were obtained during sustained productions of the vowel/Δ/. An increase in the amplitude of the laryngographie waveform upon withdrawal of the polymer strip strongly supported the concept that the laryngographic signal is generated directly by the change in conductance due to alterations in the area of vocal fold contact.


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